High-accuracy graphene quantum Hall array resistance standards based on wye-delta transformation

Abstract The wye-delta (Y-∆) transformation has been demonstrated to significantly reduce the number of Hall bars necessary for high-resistance quantum Hall array resistance standards (QHARS), addressing the spatial limitation in the practical applications. Network designs have been described for graphene-based Y-∆ arrays to realize resistance values of $$77\frac{h}{2{e}^{2}}$$ 77 h 2 e 2 ( ≈ 1 MΩ), $$775\frac{h}{2{e}^{2}}$$ 775 h 2 e 2 ( ≈ 10 MΩ), and $$7748\frac{h}{2{e}^{2}}$$ 7748 h 2 e 2 ( ≈ 100 MΩ). A programmable QHARS is conceived based on a Y-network with multiple arms. We will present the magnetoresistance transport properties of Y-∆ array devices, followed by the precision measurements of three identical devices, each consisting of 28 Hall bars. At 1.6 K, two devices are quantized at $$77\frac{h}{2{e}^{2}}$$ 77 h 2 e 2 ( ≈ 1 MΩ) to within 80 nΩ/Ω at magnetic field as low as 5 T and 6 T, respectively. Such high accuracy is achieved without cryogenic current comparator, but through a solution that utelizes the triple-connections to the three terminals of the Y-∆ array device, a dual-source bridge (DSB), and a substitution method. Our results establish the viability of a LHe-free quantum Hall resistance (QHR) system with accuracy of a few parts in 10 8 for high-resistance calibration. This system is readily adoptable to improve traceability and reduce the calibration chain for industrial applications.

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Journal
npj 2D Materials and Applications
Published
2026-11-09
DOI
https://doi.org/10.1038/s41699-026-00749-3
Primary Topic
Advanced Electrical Measurement Techniques
Type
article
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article

High-accuracy graphene quantum Hall array resistance standards based on wye-delta transformation

Kristen L. Steffens, Cheng-Hsueh Yang, Massimo Ortolano, Albert F. Rigosi et al.
npj 2D Materials and Applications
Advanced Electrical Measurement Techniques
article

High-accuracy graphene quantum Hall array resistance standards based on wye-delta transformation

Kristen L. Steffens, Cheng-Hsueh Yang, Massimo Ortolano, Albert F. Rigosi, Dean G. Jarrett, Takehiko Oe, Alireza R. Panna, Randolph E. Elmquist, Marta Musso, Ngoc Thanh Mai Tran, Chi-Te Liang, Yanfei Yang, Wei-Chen Lin
article en

Abstract

Abstract The wye-delta (Y-∆) transformation has been demonstrated to significantly reduce the number of Hall bars necessary for high-resistance quantum Hall array resistance standards (QHARS), addressing the spatial limitation in the practical applications. Network designs have been described for graphene-based Y-∆ arrays to realize resistance values of $$77\frac{h}{2{e}^{2}}$$ 77 h 2 e 2 ( ≈ 1 MΩ), $$775\frac{h}{2{e}^{2}}$$ 775 h 2 e 2 ( ≈ 10 MΩ), and $$7748\frac{h}{2{e}^{2}}$$ 7748 h 2 e 2 ( ≈ 100 MΩ). A programmable QHARS is conceived based on a Y-network with multiple arms. We will present the magnetoresistance transport properties of Y-∆ array devices, followed by the precision measurements of three identical devices, each consisting of 28 Hall bars. At 1.6 K, two devices are quantized at $$77\frac{h}{2{e}^{2}}$$ 77 h 2 e 2 ( ≈ 1 MΩ) to within 80 nΩ/Ω at magnetic field as low as 5 T and 6 T, respectively. Such high accuracy is achieved without cryogenic current comparator, but through a solution that utelizes the triple-connections to the three terminals of the Y-∆ array device, a dual-source bridge (DSB), and a substitution method. Our results establish the viability of a LHe-free quantum Hall resistance (QHR) system with accuracy of a few parts in 10 8 for high-resistance calibration. This system is readily adoptable to improve traceability and reduce the calibration chain for industrial applications.

npj 2D Materials and Applications
National Institute of Standards and Technology (US), National Taiwan University (TW), Politecnico di Torino (IT), National Tsing Hua University (TW), Joint Quantum Institute (US), National Metrology Institute of Japan (JP), University of Maryland, College Park (US), National Institute of Advanced Industrial Science and Technology (JP)
Advanced Electrical Measurement Techniques
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