High-accuracy graphene quantum Hall array resistance standards based on wye-delta transformation
Abstract The wye-delta (Y-∆) transformation has been demonstrated to significantly reduce the number of Hall bars necessary for high-resistance quantum Hall array resistance standards (QHARS), addressing the spatial limitation in the practical applications. Network designs have been described for graphene-based Y-∆ arrays to realize resistance values of $$77\frac{h}{2{e}^{2}}$$ 77 h 2 e 2 ( ≈ 1 MΩ), $$775\frac{h}{2{e}^{2}}$$ 775 h 2 e 2 ( ≈ 10 MΩ), and $$7748\frac{h}{2{e}^{2}}$$ 7748 h 2 e 2 ( ≈ 100 MΩ). A programmable QHARS is conceived based on a Y-network with multiple arms. We will present the magnetoresistance transport properties of Y-∆ array devices, followed by the precision measurements of three identical devices, each consisting of 28 Hall bars. At 1.6 K, two devices are quantized at $$77\frac{h}{2{e}^{2}}$$ 77 h 2 e 2 ( ≈ 1 MΩ) to within 80 nΩ/Ω at magnetic field as low as 5 T and 6 T, respectively. Such high accuracy is achieved without cryogenic current comparator, but through a solution that utelizes the triple-connections to the three terminals of the Y-∆ array device, a dual-source bridge (DSB), and a substitution method. Our results establish the viability of a LHe-free quantum Hall resistance (QHR) system with accuracy of a few parts in 10 8 for high-resistance calibration. This system is readily adoptable to improve traceability and reduce the calibration chain for industrial applications.
Authors
- Kristen L. Steffens (ORCID: https://orcid.org/0000-0002-3883-2131)
- Cheng-Hsueh Yang (ORCID: https://orcid.org/0009-0006-6352-3927)
- Massimo Ortolano (ORCID: https://orcid.org/0000-0002-7217-8276)
- Albert F. Rigosi (ORCID: https://orcid.org/0000-0002-8189-3829)
- Dean G. Jarrett (ORCID: https://orcid.org/0000-0003-1392-423X)
- Takehiko Oe (ORCID: https://orcid.org/0000-0003-3424-1745)
- Alireza R. Panna (ORCID: https://orcid.org/0000-0001-6557-2112)
- Randolph E. Elmquist (ORCID: https://orcid.org/0000-0001-9041-7966)
- Marta Musso (ORCID: https://orcid.org/0009-0009-1897-8828)
- Ngoc Thanh Mai Tran (ORCID: https://orcid.org/0000-0003-0346-986X)
- Chi-Te Liang
- Yanfei Yang
- Wei-Chen Lin
Institutions
- National Institute of Standards and Technology (US)
- National Taiwan University (TW)
- Politecnico di Torino (IT)
- National Tsing Hua University (TW)
- Joint Quantum Institute (US)
- National Metrology Institute of Japan (JP)
- University of Maryland, College Park (US)
- National Institute of Advanced Industrial Science and Technology (JP)
Publication Details
- Journal
- npj 2D Materials and Applications
- Published
- 2026-11-09
- DOI
- https://doi.org/10.1038/s41699-026-00749-3
- Primary Topic
- Advanced Electrical Measurement Techniques
- Type
- article
- Field-Weighted Citation Impact
- 0.00