Evaluating the inference performance of a denoising thermodynamic model under wafer-level variation in STTMRAM probabilistic bits

Authors

Publication Details

Journal
Acta Physica Sinica
Published
2026-11-07
DOI
https://doi.org/10.7498/aps.76.20261217
Primary Topic
Magnetic properties of thin films
Type
article
Field-Weighted Citation Impact
0.00
Controls
|||
ALL TIME
JAN
FEB
MAR
APR
MAY
JUN
JUL
AUG
SEP
OCT
NOV
article

Evaluating the inference performance of a denoising thermodynamic model under wafer-level variation in STTMRAM probabilistic bits

Kun Lei, WANG Xinrui, Wenhao Cai, LIU Xiangyu et al.
Acta Physica Sinica
Magnetic properties of thin films
article

Evaluating the inference performance of a denoising thermodynamic model under wafer-level variation in STTMRAM probabilistic bits

Kun Lei, WANG Xinrui, Wenhao Cai, LIU Xiangyu, CHEN Song, WANG Kaiyou
article en

Abstract

No abstract available for this paper.
Acta Physica SinicaVol. 76(3)
Openalex Percentile: Top 33%
Magnetic properties of thin films
DOIOpen Access PDFOpenAlex
AI Navigator

Ask Laika to Summarize, Analyze, and Connect papers live on the map.

Summarize Papers & Methodologies

Extract key findings, datasets, and comparative methods across publications.

Benchmark Rankings & Visual Analytics

Rank top research institutions, authors, funders, topics, and journals by Field-Weighted Citation Impact (FWCI) and paper volume with instant charts.

Connect Distant Disciplines

Bridge topological clusters on the map to find hidden collaborative intersections.

Laika access coming soon
Evaluating the inference performance of a denoising thermodynamic model under wafer-level variation in STTMRAM probabilistic bits — Kun Lei, WANG Xinrui, et al. · Acta Physica Sinica (2026) | TGRS Research Map | TGRS