Controlling Compensation Doping via Multivalent Platinum Acceptors in Tantalum Oxide Thin Films

Abstract Heterostructures of platinum (Pt) and tantalum oxide (Ta2O5) find widespread use in electronic and energy-conversion device applications, yet the electronic role of Pt incorporated within Ta2O5 remains poorly understood. Here, we investigate the influence of Pt incorporation on the electronic structure and properties of amorphous Ta2O5 using two precisely controlled ternary atomic layer deposition (ALD) pathways. Oxygen plasma-enhanced deposition produces host matrices with significantly lower native defect and impurity concentrations than conventional thermal water-based ALD, enabling a systematic investigation of the interplay between Pt dopants and native defects. Controlled Pt incorporation over the range of 0.9–1.9 atom % yields homogeneous, amorphous Pt-doped Ta2O5 thin films containing exclusively Pt(II) and Pt(IV) oxidation states, with no evidence of metallic Pt formation. While the optical bandgap of the Ta2O5 host matrix remains largely unchanged, Pt incorporation introduces optically active acceptor states near the valence band maximum, increases sub-bandgap absorption, and shifts the Fermi level toward the midgap. The relative Pt(II)/Pt(IV) population depends strongly on the defect landscape of the host matrix and exhibits a linear dependence on the Fermi level position, demonstrating Fermi level-controlled charge compensation between native donor defects and multivalent Pt acceptor states. Density functional theory corroborates the acceptor character of Pt and assigns the introduced states primarily to Pt 5d orbitals. Experimentally constructed band diagrams and charge transport measurements further show that Pt incorporation provides a direct means of tuning the electronic properties of Ta2O5. These results demonstrate that multivalent Pt doping serves as a controllable strategy for engineering the electronic structure and transport characteristics of functional Ta2O5 thin films, with direct relevance to memristive, dielectric, and photoelectrochemical devices.

Authors

Institutions

Publication Details

Journal
ACS Applied Materials & Interfaces
Published
2026-11-05
DOI
https://doi.org/10.1021/acsami.6c14148
Primary Topic
Semiconductor materials and devices
Type
article
Field-Weighted Citation Impact
0.00
Controls
|||
ALL TIME
JAN
FEB
MAR
APR
MAY
JUN
JUL
AUG
SEP
OCT
NOV
article

Controlling Compensation Doping via Multivalent Platinum Acceptors in Tantalum Oxide Thin Films

Christian Pfeiffer, Verena Streibel, Matthias M. May, Holger Euchner et al.
ACS Applied Materials & Interfaces
Semiconductor materials and devices
article

Controlling Compensation Doping via Multivalent Platinum Acceptors in Tantalum Oxide Thin Films

Christian Pfeiffer, Verena Streibel, Matthias M. May, Holger Euchner, Tim Rieth, Ian D. Sharp, Julius Kleusberg, Valentin Walbrunn
article en

Abstract

Abstract Heterostructures of platinum (Pt) and tantalum oxide (Ta2O5) find widespread use in electronic and energy-conversion device applications, yet the electronic role of Pt incorporated within Ta2O5 remains poorly understood. Here, we investigate the influence of Pt incorporation on the electronic structure and properties of amorphous Ta2O5 using two precisely controlled ternary atomic layer deposition (ALD) pathways. Oxygen plasma-enhanced deposition produces host matrices with significantly lower native defect and impurity concentrations than conventional thermal water-based ALD, enabling a systematic investigation of the interplay between Pt dopants and native defects. Controlled Pt incorporation over the range of 0.9–1.9 atom % yields homogeneous, amorphous Pt-doped Ta2O5 thin films containing exclusively Pt(II) and Pt(IV) oxidation states, with no evidence of metallic Pt formation. While the optical bandgap of the Ta2O5 host matrix remains largely unchanged, Pt incorporation introduces optically active acceptor states near the valence band maximum, increases sub-bandgap absorption, and shifts the Fermi level toward the midgap. The relative Pt(II)/Pt(IV) population depends strongly on the defect landscape of the host matrix and exhibits a linear dependence on the Fermi level position, demonstrating Fermi level-controlled charge compensation between native donor defects and multivalent Pt acceptor states. Density functional theory corroborates the acceptor character of Pt and assigns the introduced states primarily to Pt 5d orbitals. Experimentally constructed band diagrams and charge transport measurements further show that Pt incorporation provides a direct means of tuning the electronic properties of Ta2O5. These results demonstrate that multivalent Pt doping serves as a controllable strategy for engineering the electronic structure and transport characteristics of functional Ta2O5 thin films, with direct relevance to memristive, dielectric, and photoelectrochemical devices.

ACS Applied Materials & Interfaces
Technical University of Munich (DE), University of Tübingen (DE)
Openalex Percentile: Top 25%
Semiconductor materials and devices
AI Navigator

Ask Laika to Summarize, Analyze, and Connect papers live on the map.

Summarize Papers & Methodologies

Extract key findings, datasets, and comparative methods across publications.

Benchmark Rankings & Visual Analytics

Rank top research institutions, authors, funders, topics, and journals by Field-Weighted Citation Impact (FWCI) and paper volume with instant charts.

Connect Distant Disciplines

Bridge topological clusters on the map to find hidden collaborative intersections.

Laika access coming soon