Statistical outlier detection for polarity-invariant accelerated autofocusing in lensless in-line digital holography

Automatic focusing in lensless in-line digital holography typically reconstructs candidate axial planes, evaluates a scalar focus metric, and searches for its extremum. This approach faces two limitations: focal response polarity depends on the object type and underlying focus operator, whereas exhaustive fine-grid scanning requires numerous propagations over wide axial ranges. To address these limitations, we propose a polarity-invariant accelerated autofocus framework based on statistical outlier detection of axial metric sequences generated by existing focus operators. The axial metric sequence is modeled as a dominant defocus background with sparse focal deviations, and a two-tailed standardized deviation converts deviations of either polarity into a unified maximization problem, eliminating the need for object-type priors or manual polarity selection. A focal–nonfocal separation condition characterizes when the focal response remains dominant. For single-plane autofocus, an online background estimator is combined with a coarse-to-fine search in which a significant local anomaly triggers early stopping and local refinement. Simulations and real-hologram experiments with multiple underlying focus operators show that the proposed framework resolves polarity inconsistency for amplitude, phase, and mixed amplitude–phase scenes. In the single-plane setting, the accelerated search produces focal estimates consistent with exhaustive fine scanning, with propagation-evaluation speedup factors of 4.9 to 6.4 in the representative simulations and 3.5 to 3.8 on real holograms; the corresponding runtime speedup factors on real holograms are 3.7 to 4.3.

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Publication Details

Journal
Optical Engineering
Published
2026-11-05
DOI
https://doi.org/10.1117/1.oe.65.11.113102
Primary Topic
Digital Holography and Microscopy
Type
article
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article

Statistical outlier detection for polarity-invariant accelerated autofocusing in lensless in-line digital holography

Bing Xu, Jing Ling, Junchen Ge, Longfei Ge et al.
Optical Engineering
Digital Holography and Microscopy
article

Statistical outlier detection for polarity-invariant accelerated autofocusing in lensless in-line digital holography

Bing Xu, Jing Ling, Junchen Ge, Longfei Ge, Huimin Xia
article en

Abstract

Automatic focusing in lensless in-line digital holography typically reconstructs candidate axial planes, evaluates a scalar focus metric, and searches for its extremum. This approach faces two limitations: focal response polarity depends on the object type and underlying focus operator, whereas exhaustive fine-grid scanning requires numerous propagations over wide axial ranges. To address these limitations, we propose a polarity-invariant accelerated autofocus framework based on statistical outlier detection of axial metric sequences generated by existing focus operators. The axial metric sequence is modeled as a dominant defocus background with sparse focal deviations, and a two-tailed standardized deviation converts deviations of either polarity into a unified maximization problem, eliminating the need for object-type priors or manual polarity selection. A focal–nonfocal separation condition characterizes when the focal response remains dominant. For single-plane autofocus, an online background estimator is combined with a coarse-to-fine search in which a significant local anomaly triggers early stopping and local refinement. Simulations and real-hologram experiments with multiple underlying focus operators show that the proposed framework resolves polarity inconsistency for amplitude, phase, and mixed amplitude–phase scenes. In the single-plane setting, the accelerated search produces focal estimates consistent with exhaustive fine scanning, with propagation-evaluation speedup factors of 4.9 to 6.4 in the representative simulations and 3.5 to 3.8 on real holograms; the corresponding runtime speedup factors on real holograms are 3.7 to 4.3.

Optical EngineeringVol. 65(11)
Anhui Jianzhu University (CN), Chaohu University (CN)
Openalex Percentile: Top 22%
Digital Holography and Microscopy
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