X-ray tomography and coordinate metrology benchmark for internal cavities in additively manufactured alloys
Abstract X-ray computed tomography (CT) is widely used for dimensional inspection of inaccessible internal geometry, but multi-modal public benchmark datasets with reference metrology remain scarce, particularly for internal cavities. This paper releases a CT--coordinate measuring machine (CMM) benchmark for wall-thickness measurements using CT surface extraction of an artefact with a complex internal cavity that is disassembled for tactile probing. Four cases span Ti-6Al-4V and Inconel 625 in rough and chemically milled states. Each case includes nominal computer-aided design (CAD) geometry aligned to the CT reconstruction, CT projections, reconstructed volumes, CT surface segmentations, CMM point clouds with predefined thickness-pair vectors, and derived surface- and thickness-deviation labels. The paper defines the benchmark tasks and reporting convention and reports baseline results for reconstruction-based and CAD-informed routes. The benchmark permits validation of CT-based dimensional metrology in noisy and clean environments, including CAD-constrained surface reconstruction approaches that work entirely in projection space, such as elastic registration.
Authors
- François Guibault (ORCID: https://orcid.org/0000-0002-3934-4631)
- Hristo Valtchanov (ORCID: https://orcid.org/0000-0003-0580-1678)
- Vladimir Braïlovski (ORCID: https://orcid.org/0000-0003-0035-8566)
- Josselin Paccoud
- Eric Fournier
Institutions
- Polytechnique Montréal (CA)
- École de Technologie Supérieure (CA)
Publication Details
- Journal
- Research Square
- Published
- 2026-11-04
- DOI
- https://doi.org/10.21203/rs.3.rs-11393438/v1
- Primary Topic
- Advanced Measurement and Metrology Techniques
- Type
- preprint