VerdictAD: Few-Shot Anomaly Detection via Decision-Guided Refinement

Detecting defects in real-world industrial inspection often requires learning from only a few normal images per category. Recent few-shot anomaly detection methods have achieved strong performance by measuring feature differences between query images and normal references. However, visual differences do not always indicate genuine defects, as normal appearance variations can also produce high anomaly scores. Conversely, structural or logical anomalies may not produce strong local feature differences, making them difficult to detect. To address this limitation, we introduce VerdictAD, a training-free framework that refines existing anomaly detectors through visual decisions. Rather than replacing existing detectors, VerdictAD adopts a typed decision model to assess the query image and its local regions against a few normal references. By directly producing structured decision probabilities without text generation, the model provides complementary evidence for refining anomaly responses at different spatial scales. Building on this capability, we introduce two modules: Global Verdict Refinement (GVR) uses image-level decisions to refine the overall anomaly score, while Local Verdict Refinement (LVR) aggregates regional decisions to refine the anomaly map. Combined with a simple DINOv2-based detector, VerdictAD achieves competitive performance in one-shot and few-shot anomaly detection. More importantly, as a plug-and-play framework, it consistently improves existing anomaly detectors across MVTec AD, VisA, and MVTec LOCO AD, achieving strong results across one-shot and few-shot settings. Our code and experimental logs are publicly available at https://github.com/sgstq0811/VerdictAD-Jev-AD.

Authors

Publication Details

Journal
arXiv (Cornell University)
Published
2026-11-02
DOI
https://doi.org/10.48550/arxiv.2611.02654
Primary Topic
Industrial Vision Systems and Defect Detection
Type
preprint
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preprint

VerdictAD: Few-Shot Anomaly Detection via Decision-Guided Refinement

Wenjun Luo, Ruoyu Chen, Yuanzhi Wang, Shangquan Sun et al.
arXiv (Cornell University)
Industrial Vision Systems and Defect Detection
preprint

VerdictAD: Few-Shot Anomaly Detection via Decision-Guided Refinement

Wenjun Luo, Ruoyu Chen, Yuanzhi Wang, Shangquan Sun, Shijian Lu, Ruiqi Li, Jiachen Liu
preprint en

Abstract

Detecting defects in real-world industrial inspection often requires learning from only a few normal images per category. Recent few-shot anomaly detection methods have achieved strong performance by measuring feature differences between query images and normal references. However, visual differences do not always indicate genuine defects, as normal appearance variations can also produce high anomaly scores. Conversely, structural or logical anomalies may not produce strong local feature differences, making them difficult to detect. To address this limitation, we introduce VerdictAD, a training-free framework that refines existing anomaly detectors through visual decisions. Rather than replacing existing detectors, VerdictAD adopts a typed decision model to assess the query image and its local regions against a few normal references. By directly producing structured decision probabilities without text generation, the model provides complementary evidence for refining anomaly responses at different spatial scales. Building on this capability, we introduce two modules: Global Verdict Refinement (GVR) uses image-level decisions to refine the overall anomaly score, while Local Verdict Refinement (LVR) aggregates regional decisions to refine the anomaly map. Combined with a simple DINOv2-based detector, VerdictAD achieves competitive performance in one-shot and few-shot anomaly detection. More importantly, as a plug-and-play framework, it consistently improves existing anomaly detectors across MVTec AD, VisA, and MVTec LOCO AD, achieving strong results across one-shot and few-shot settings. Our code and experimental logs are publicly available at https://github.com/sgstq0811/VerdictAD-Jev-AD.

arXiv (Cornell University)
Industrial Vision Systems and Defect Detection
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