Same Raw Data, Different Numbers: Locked Analysis Rules Make Film Descriptors of Organic Semiconductors Reproducible

Optical gaps, Urbach energies, oxidation potentials, surface correlation lengths, diffraction order and thermal transitions are used to rank organic semiconductor films, yet each number is the output of an analysis whose discretionary steps are rarely fixed. Here a protocol card is introduced in which every descriptor is extracted by a locked rule and accepted only if it passes a stated test; otherwise it is reported as “not determined”. Each rule is stress-tested against the choices it fixes. Applied to the archived raw data of three deep-blue phosphine-oxide host films, a free choice of fit window lets the Urbach energy of the same spectra range from 0.21 to 0.94 eV, whereas the locked rule returns 0.22–0.24 eV for all three hosts on glass. The same protocol dependence appears in onset versus peak oxidation potentials, AFM correlation lengths, diffraction baselines, the mass basis of weight-loss temperatures and the functional used for computed orbital energies. Ten locked rules with their stress tests make every reported value auditable and every missing value explicit, and propose a reporting protocol for molecular semiconductor films.