Statistical Pathologies, Critical Thresholds, and Identification Boundaries in LLM-Driven Analytics: From Market Basket Analysis, Logit Regression, and Structural Equation Modeling to High-Dimensional Dynamic A/B Testing

Statistical Pathologies, Critical Thresholds, andIdentification Boundaries in LLM-Driven Analytics:From Market Basket Analysis, Logit Regression, andStructural Equation Modeling to High-DimensionalDynamic A/B Testing

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Journal
Zenodo (CERN European Organization for Nuclear Research)
Published
2026-10-29
DOI
https://doi.org/10.5281/zenodo.23772696
Primary Topic
Statistical Methods and Applications
Type
preprint
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preprint

Statistical Pathologies, Critical Thresholds, and Identification Boundaries in LLM-Driven Analytics: From Market Basket Analysis, Logit Regression, and Structural Equation Modeling to High-Dimensional Dynamic A/B Testing

Yasuko Kawahata
1 links
Zenodo (CERN European Organization for Nuclear Research)
Statistical Methods and Applications
preprint

Statistical Pathologies, Critical Thresholds, and Identification Boundaries in LLM-Driven Analytics: From Market Basket Analysis, Logit Regression, and Structural Equation Modeling to High-Dimensional Dynamic A/B Testing

Yasuko Kawahata
preprint en

Abstract

Statistical Pathologies, Critical Thresholds, andIdentification Boundaries in LLM-Driven Analytics:From Market Basket Analysis, Logit Regression, andStructural Equation Modeling to High-DimensionalDynamic A/B Testing

Zenodo (CERN European Organization for Nuclear Research)
Rikkyo University (JP)
Statistical Methods and Applications
DOIOpen Access PDFOpenAlex
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Statistical Pathologies, Critical Thresholds, and Identification Boundaries in LLM-Driven Analytics: From Market Basket Analysis, Logit Regression, and Structural Equation Modeling to High-Dimensional Dynamic A/B Testing — Yasuko Kawahata · Zenodo (CERN European Organization for Nuclear Research) (2026) | TGRS Research Map | TGRS