Single-Wafer Sublimation Drying Process Achieves Damage-Free Results for Ultra-HAR Structures

Of all the emerging drying technologies to mitigate pattern collapse, sublimation drying is particularly promising due to its simple process conditions and low cost of ownership. In this work, we developed a single wafer sublimation drying process using a custom-formulated sublimation chemical. Process optimization is mainly achieved by fine-tuning the film thickness through wafer rotation and optimizing the chemical concentrations. The optimized sublimation drying process demonstrated damage-free results on ultra-HAR fin structures, significantly outperforming conventional drying techniques such as IPA, hot IPA, and SMT drying.

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Journal
Diffusion and defect data, solid state data. Part B, Solid state phenomena/Solid state phenomena
Published
2026-10-29
DOI
https://doi.org/10.4028/p-sxfks9
Primary Topic
Advancements in Photolithography Techniques
Type
article
Field-Weighted Citation Impact
0.00

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article

Single-Wafer Sublimation Drying Process Achieves Damage-Free Results for Ultra-HAR Structures

Tomoya Tanaka, Yukifumi Yoshida, XiuMei Xu, Hikaru Kawarazaki et al.
2 links
Diffusion and defect data, solid state data. Part B, Solid state phenomena/Solid state phenomena
Advancements in Photolithography Techniques
article

Single-Wafer Sublimation Drying Process Achieves Damage-Free Results for Ultra-HAR Structures

Tomoya Tanaka, Yukifumi Yoshida, XiuMei Xu, Hikaru Kawarazaki, Takayoshi Tanaka, Teppei Nakano
article en

Abstract

Of all the emerging drying technologies to mitigate pattern collapse, sublimation drying is particularly promising due to its simple process conditions and low cost of ownership. In this work, we developed a single wafer sublimation drying process using a custom-formulated sublimation chemical. Process optimization is mainly achieved by fine-tuning the film thickness through wafer rotation and optimizing the chemical concentrations. The optimized sublimation drying process demonstrated damage-free results on ultra-HAR fin structures, significantly outperforming conventional drying techniques such as IPA, hot IPA, and SMT drying.

Diffusion and defect data, solid state data. Part B, Solid state phenomena/Solid state phenomenaVol. 395
IMEC (BE), SCREEN Semiconductor Solutions Co., Ltd. (Japan) (JP)
European Commission, Vlaamse regering, HORIZON EUROPE Framework Programme
Industry, innovation and infrastructure
Openalex Percentile: Top 24%
Advancements in Photolithography Techniques
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Single-Wafer Sublimation Drying Process Achieves Damage-Free Results for Ultra-HAR Structures — Tomoya Tanaka, Yukifumi Yoshida, et al. · Diffusion and defect data, solid state data. Part B, Solid state phenomena/Solid state phenomena (2026) | TGRS Research Map | TGRS