Industrial defect image generation via structured latent-space interpolation
Abstract Industrial visual defect detection suffers from scarce defect samples, limiting generalization. We propose a novel image generation framework that synthesizes diverse and realistic defect images through three sequential innovations. First, we introduce UMAP-based dimensionality reduction to project VAE latent features onto a low-dimensional manifold while preserving local neighborhood structure, thereby enabling artifact-free sampling in the subsequent stage. Second, we design a PSO-optimized Gaussian mixture model to capture the sparse, multimodal distribution of defect features within this manifold, and sample new coordinates from high-likelihood regions to generate diverse yet realistic defect representations. Third, we employ a non-parametric radial basis function interpolator to map these sampled coordinates back to the original VAE latent space, preserving geometric continuity and restoring high-frequency defect details before decoding. Experiments on bearing-defect and public industrial datasets show that detectors trained with a synthetic-to-real ratio $$\le 1:3$$ achieve superior accuracy and robustness, validating each innovation’s effectiveness.
Authors
- Yan Cang (ORCID: https://orcid.org/0000-0001-7037-3214)
- Haotian Rong
- Ziwei Zhou
- Ruikai Zou
- Jun Ma
Institutions
- Harbin Engineering University (CN)
- Chinese Academy of Sciences (CN)
- East University Of Heilongjiang (CN)
- Innovation Academy for Microsatellites of Chinese Academy of Sciences (CN)
Publication Details
- Journal
- Scientific Reports
- Published
- 2026-10-29
- DOI
- https://doi.org/10.1038/s41598-026-76001-1
- Primary Topic
- Industrial Vision Systems and Defect Detection
- Type
- article
- Field-Weighted Citation Impact
- 0.00
Funders
- Department of Education, Heilongjiang Province
- Ministry of Education, India
- Minzu University of China
- Fundamental Research Funds for the Central Universities