High-Performance and Safer Wet Stripper for 50 to 400 µm-Thick Negative Photoresists and Laminated Films in Wafer Level Packaging

Thick negative-tone photoresists are increasingly used to fabricate high-aspect-ratio structures such as copper pillars, which are critical in advanced packaging technologies. However, their high film thicknesses and strong crosslinking make complete removal particularly challenging. This study presents the development of a new photoresist stripper formulation, free of N-methyl-2-pyrrolidone (NMP) and tetramethylammonium hydroxide (TMAH), designed to address both efficiency and material compatibility requirements in advanced packaging environments. Through a systematic formulation approach, including each formulation components screening, an optimized stripper was developped. Compared to conventional TMAH-based strippers, this new formulation enables significantly faster stripping of thick resists, up to 400 µm, and laminated films, while maintaining excellent compatibility with sensitive materials. The results validate its performance across a range of advanced applications, while offering substantial safety and environmental benefits.

Authors

Publication Details

Journal
Diffusion and defect data, solid state data. Part B, Solid state phenomena/Solid state phenomena
Published
2026-10-29
DOI
https://doi.org/10.4028/p-36bmra
Primary Topic
Advancements in Photolithography Techniques
Type
article
Field-Weighted Citation Impact
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article

High-Performance and Safer Wet Stripper for 50 to 400 µm-Thick Negative Photoresists and Laminated Films in Wafer Level Packaging

Jérôme Daviot, Loriana Celeste, Diane Bijou
2 links
Diffusion and defect data, solid state data. Part B, Solid state phenomena/Solid state phenomena
Advancements in Photolithography Techniques
article

High-Performance and Safer Wet Stripper for 50 to 400 µm-Thick Negative Photoresists and Laminated Films in Wafer Level Packaging

Jérôme Daviot, Loriana Celeste, Diane Bijou
article en

Abstract

Thick negative-tone photoresists are increasingly used to fabricate high-aspect-ratio structures such as copper pillars, which are critical in advanced packaging technologies. However, their high film thicknesses and strong crosslinking make complete removal particularly challenging. This study presents the development of a new photoresist stripper formulation, free of N-methyl-2-pyrrolidone (NMP) and tetramethylammonium hydroxide (TMAH), designed to address both efficiency and material compatibility requirements in advanced packaging environments. Through a systematic formulation approach, including each formulation components screening, an optimized stripper was developped. Compared to conventional TMAH-based strippers, this new formulation enables significantly faster stripping of thick resists, up to 400 µm, and laminated films, while maintaining excellent compatibility with sensitive materials. The results validate its performance across a range of advanced applications, while offering substantial safety and environmental benefits.

Diffusion and defect data, solid state data. Part B, Solid state phenomena/Solid state phenomenaVol. 395
Openalex Percentile: Top 25%
Advancements in Photolithography Techniques
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