Study of Multilayer TiNx/Ti/TiNx Films Formed In Situ for High-Efficiency Integrated Microheaters
A technology for the in situ formation of a three-layer TiN$_x$/Ti/TiN$_x$ functional material within a single vacuum cycle is presented, together with the results of investigations of its structural and electrophysical properties. The maximum critical power density reached approximately 140 MW/cm$^2$. Under continuous operation at 90% of the critical power, the structures remained operational for 24 h. The characteristics of microbridges without and with a protective SiO$_x$ layer were compared. The presence of the coating modifies the electrothermal operating regime of the structures and enables estimated temperatures of approximately 500-700 degrees Celsius to be reached.
Authors
- I. V. Trofimov (ORCID: https://orcid.org/0009-0002-6464-1950)
- Z. S. Enbaev (ORCID: https://orcid.org/0000-0003-3970-8105)
- Michael A. Tarkhov (ORCID: https://orcid.org/0000-0001-8168-1917)
- Alexander Shevchenko (ORCID: https://orcid.org/0000-0001-5403-1919)
- Mikhail V. Tsvetkov (ORCID: https://orcid.org/0009-0005-2944-7038)
- Aleksander M. Mumlyakov
- Mikael O. Geodakyan
- Pavel A. Berezhnoy
- Oleg A. Solovyev
Publication Details
- Journal
- arXiv (Cornell University)
- Published
- 2026-10-27
- DOI
- https://doi.org/10.48550/arxiv.2610.37130
- Primary Topic
- Advanced MEMS and NEMS Technologies
- Type
- preprint