Direct optical thermometry in semiconductors

This pedagogical review offers an easy access to three direct optical methods (photoluminescence, absorption, and Raman spectroscopies) to probe temperatures in out-of-equilibrium semiconductor devices. For each technique, starting from basic considerations, the operating principles and usual assumptions are clarified; the strategy to acquire and analyze data is explained, and the most critical points of attention are underlined with examples. Decision trees and a comparison table are provided to help identify the best suited approach to specific characterization needs.

Authors

Institutions

Publication Details

Journal
Journal of Applied Physics
Published
2026-10-27
DOI
https://doi.org/10.1063/5.0355057
Primary Topic
Integrated Circuits and Semiconductor Failure Analysis
Type
article
Field-Weighted Citation Impact
0.00

Funders

Controls
|||
ALL TIME
JAN
FEB
MAR
APR
MAY
JUN
JUL
AUG
SEP
OCT
article

Direct optical thermometry in semiconductors

Daniel Suchet, Maxime Giteau, Sarah Houver, Jean‐François Guillemoles et al.
Journal of Applied Physics
Integrated Circuits and Semiconductor Failure Analysis
article

Direct optical thermometry in semiconductors

Daniel Suchet, Maxime Giteau, Sarah Houver, Jean‐François Guillemoles, Nathan Roubinowitz, Bernice Mae F. Yu Jeco, Yoshitaka Okada, Thomas Vezin, S. Der, S. Rani, M. Legrand
article en

Abstract

This pedagogical review offers an easy access to three direct optical methods (photoluminescence, absorption, and Raman spectroscopies) to probe temperatures in out-of-equilibrium semiconductor devices. For each technique, starting from basic considerations, the operating principles and usual assumptions are clarified; the strategy to acquire and analyze data is explained, and the most critical points of attention are underlined with examples. Decision trees and a comparison table are provided to help identify the best suited approach to specific characterization needs.

Journal of Applied PhysicsVol. 140(16)
Centre National de la Recherche Scientifique (FR), École Polytechnique (FR), Chimie ParisTech - PSL (FR), Université Paris Cité (FR), Laboratoire Matériaux et Phénomènes Quantiques (FR), Institut Polytechnique de Paris (FR), Laboratoire Procédés, Matériaux et Energie Solaire (FR), Institut Photovoltaïque d’Île-de-France (FR), Research Center for Advanced Science and Technology, The University of Tokyo (JP), The University of Tokyo (JP), West Visayas State University (PH)
Japan Society for the Promotion of Science London, European Research Council
Openalex Percentile: Top 24%
Integrated Circuits and Semiconductor Failure Analysis
AI Navigator

Ask Laika to Summarize, Analyze, and Connect papers live on the map.

Summarize Papers & Methodologies

Extract key findings, datasets, and comparative methods across publications.

Benchmark Rankings & Visual Analytics

Rank top research institutions, authors, funders, topics, and journals by Field-Weighted Citation Impact (FWCI) and paper volume with instant charts.

Connect Distant Disciplines

Bridge topological clusters on the map to find hidden collaborative intersections.

Laika access coming soon