A novel absolute distribution measurement method of beam spot on target surface in intense pulsed neutron generator

The typical characteristic of high current and narrow pulse neutron generator is to produce complex mixed ion beams, and the instantaneous beam intensity can reach ampere level, which makes it difficult to diagnose the beam profile distribution and deuterium ion composition distribution. Especially, the spatial distribution of deuterium/titanium ion ratio on the target surface cannot be obtained, and there is no measurement method for the absolute beam cross section distribution on the target surface. In this paper, we propose that the single crystal silicon + secondary ion mass spectrometry method can obtain the relative distribution of various ion components on the target surface. Combined with the measurement of target current and neutron yield, the absolute cross-section distribution of multi-component high-current ion beams in complex mixed ion beams and the spatial distribution of deuterium ion ratio on the target surface can be obtained. This can guide the beam optical design of high-intensity and narrow-pulse neutron generators, and will be helpful to the physical design of targets and the study of beam-target interaction.