Beyond Word-Local ECC: A Bounded-Residual Certified Post-Failure Recovery Architecture for Clustered Upsets in Interleaved SRAM

Physical faults can cross error-correcting code (ECC) word boundaries even when static random-access memory (SRAM) protection remains word-local. This work proposes a bounded-residual certified post-failure recovery architecture for interleaved single-error-correcting, double-error-detecting (SEC-DED) SRAM. Once a complete one- or two-tile recovery window is acquired—either immediately upon a demand-path word-local detected-uncorrectable error (DUE) or during periodic integrity scrubbing—ordinary word syndromes and the known reverse interleaving map generate bounded physical fault hypotheses, while independently protected tile metadata alone authorizes memory write-back. We show that finite randomized testing is insufficient for selecting that certificate: a standard 16-bit cyclic redundancy check (CRC-16) baseline passes extensive adversarial fault-injection campaigns without observed false corrections, yet exact algebraic residual analysis exposes deterministic silent data corruption (SDC) aliases and an explicit silent-correction witness. A parity-split residual-support lemma proves that under the weight-one/two per-word error model, distinct syndrome-equivalent explanations agree on every odd-parity single-error-correcting (SEC) word and can differ only on even-parity double-error-detecting (DED) words. This structural property yields two explicit authorization policies: a strict Commit-Exact mode that bounds active DED words per checked tile so that every authorized write-back lies inside the unrestricted exact one- and two-word residual domain, and a Commit-Env mode that retains the full frozen supported topology envelope, whose complete one-, two-, three-, and four-word candidate-difference space and two-tile boundary extension exhibit zero supported collisions under a fixed 32-bit Castagnoli cyclic redundancy check (CRC-32C) profile. Conditional on complete observation-window acquisition under the reference evaluation, the architecture recovers all template-exhaustive in-support, unseen-connected, and boundary-crossing failures and a high proportion of perturbed-shape failures while committing zero false corrections at modest metadata storage overhead. All formal safety and recovery guarantees remain explicitly conditional on the active commit mode (Commit-Exact or Commit-Env), complete observation-window acquisition, and the stated fault-model assumptions, namely bounded per-word candidate multiplicity, valid and coherent protected metadata, and complete candidate enumeration.

Authors

Institutions

Publication Details

Journal
Electronics
Published
2026-10-15
DOI
https://doi.org/10.3390/electronics15204738
Primary Topic
Radiation Effects in Electronics
Type
article
Field-Weighted Citation Impact
0.00
Controls
|||
ALL TIME
JAN
FEB
MAR
APR
MAY
JUN
JUL
AUG
SEP
OCT
article

Beyond Word-Local ECC: A Bounded-Residual Certified Post-Failure Recovery Architecture for Clustered Upsets in Interleaved SRAM

Larisa Goffman-Vinopal
Electronics
Radiation Effects in Electronics
article

Beyond Word-Local ECC: A Bounded-Residual Certified Post-Failure Recovery Architecture for Clustered Upsets in Interleaved SRAM

Larisa Goffman-Vinopal
article en

Abstract

Physical faults can cross error-correcting code (ECC) word boundaries even when static random-access memory (SRAM) protection remains word-local. This work proposes a bounded-residual certified post-failure recovery architecture for interleaved single-error-correcting, double-error-detecting (SEC-DED) SRAM. Once a complete one- or two-tile recovery window is acquired—either immediately upon a demand-path word-local detected-uncorrectable error (DUE) or during periodic integrity scrubbing—ordinary word syndromes and the known reverse interleaving map generate bounded physical fault hypotheses, while independently protected tile metadata alone authorizes memory write-back. We show that finite randomized testing is insufficient for selecting that certificate: a standard 16-bit cyclic redundancy check (CRC-16) baseline passes extensive adversarial fault-injection campaigns without observed false corrections, yet exact algebraic residual analysis exposes deterministic silent data corruption (SDC) aliases and an explicit silent-correction witness. A parity-split residual-support lemma proves that under the weight-one/two per-word error model, distinct syndrome-equivalent explanations agree on every odd-parity single-error-correcting (SEC) word and can differ only on even-parity double-error-detecting (DED) words. This structural property yields two explicit authorization policies: a strict Commit-Exact mode that bounds active DED words per checked tile so that every authorized write-back lies inside the unrestricted exact one- and two-word residual domain, and a Commit-Env mode that retains the full frozen supported topology envelope, whose complete one-, two-, three-, and four-word candidate-difference space and two-tile boundary extension exhibit zero supported collisions under a fixed 32-bit Castagnoli cyclic redundancy check (CRC-32C) profile. Conditional on complete observation-window acquisition under the reference evaluation, the architecture recovers all template-exhaustive in-support, unseen-connected, and boundary-crossing failures and a high proportion of perturbed-shape failures while committing zero false corrections at modest metadata storage overhead. All formal safety and recovery guarantees remain explicitly conditional on the active commit mode (Commit-Exact or Commit-Env), complete observation-window acquisition, and the stated fault-model assumptions, namely bounded per-word candidate multiplicity, valid and coherent protected metadata, and complete candidate enumeration.

ElectronicsVol. 15(20)
Bar-Ilan University (IL)
Openalex Percentile: Top 24%
Radiation Effects in Electronics
AI Navigator

Ask Laika to Summarize, Analyze, and Connect papers live on the map.

Summarize Papers & Methodologies

Extract key findings, datasets, and comparative methods across publications.

Benchmark Rankings & Visual Analytics

Rank top research institutions, authors, funders, topics, and journals by Field-Weighted Citation Impact (FWCI) and paper volume with instant charts.

Connect Distant Disciplines

Bridge topological clusters on the map to find hidden collaborative intersections.