Low-temperature fabrication of TiO2 electron transport layers by solid-state electrochemical oxidation for selenium photovoltaics

In this study, titanium oxide (TiO 2 ) prepared via a solid-state electrochemical oxidation process was characterized and applied in photovoltaic devices employing a selenium light-absorbing layer with a bandgap of 1.9 eV, making it promising for indoor photovoltaic (IPV) applications. This process enables the oxidation of titanium metal thin films at relatively low temperatures, facilitating the formation of electron transport layers that may be suitable for future application to flexible substrates. The fabricated TiO 2 thin films were employed as electron transport layers in selenium-based photovoltaic devices. Ultraviolet photoelectron spectroscopy (UPS), X-ray photoelectron spectroscopy (XPS), and transmittance spectroscopy revealed a conduction band offset of −0.42 to −0.47 eV with selenium, resulting in the formation of a cliff-type junction. This band alignment is comparable to that reported for sputter-deposited ZnMgO and TiO 2 electron transport layers used in high-performance Se thin-film solar cells. Au/MoO 3 /p-Se/Te/n-TiO 2 /ITO photovoltaic devices achieved a power conversion efficiency of 3.5% after heat and light soaking treatment. These results demonstrate the feasibility of solid-state electrochemically oxidized TiO 2 as an electron transport layer for selenium photovoltaics and establish solid-state electrochemical oxidation as a low-temperature and solvent-free fabrication route for future flexible optoelectronic devices.

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Publication Details

Journal
Materials Science in Semiconductor Processing
Published
2026-10-09
DOI
https://doi.org/10.1016/j.mssp.2026.111271
Primary Topic
Chalcogenide Semiconductor Thin Films
Type
article
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article

Low-temperature fabrication of TiO2 electron transport layers by solid-state electrochemical oxidation for selenium photovoltaics

Junji Murata, Taizo R. Kobayashi, Saiki Kitagawa, Ryota Ogata et al.
Materials Science in Semiconductor Processing
Chalcogenide Semiconductor Thin Films
article

Low-temperature fabrication of TiO2 electron transport layers by solid-state electrochemical oxidation for selenium photovoltaics

Junji Murata, Taizo R. Kobayashi, Saiki Kitagawa, Ryota Ogata, Kodai Hikita, Shinpei Hayakawa
article en

Abstract

In this study, titanium oxide (TiO 2 ) prepared via a solid-state electrochemical oxidation process was characterized and applied in photovoltaic devices employing a selenium light-absorbing layer with a bandgap of 1.9 eV, making it promising for indoor photovoltaic (IPV) applications. This process enables the oxidation of titanium metal thin films at relatively low temperatures, facilitating the formation of electron transport layers that may be suitable for future application to flexible substrates. The fabricated TiO 2 thin films were employed as electron transport layers in selenium-based photovoltaic devices. Ultraviolet photoelectron spectroscopy (UPS), X-ray photoelectron spectroscopy (XPS), and transmittance spectroscopy revealed a conduction band offset of −0.42 to −0.47 eV with selenium, resulting in the formation of a cliff-type junction. This band alignment is comparable to that reported for sputter-deposited ZnMgO and TiO 2 electron transport layers used in high-performance Se thin-film solar cells. Au/MoO 3 /p-Se/Te/n-TiO 2 /ITO photovoltaic devices achieved a power conversion efficiency of 3.5% after heat and light soaking treatment. These results demonstrate the feasibility of solid-state electrochemically oxidized TiO 2 as an electron transport layer for selenium photovoltaics and establish solid-state electrochemical oxidation as a low-temperature and solvent-free fabrication route for future flexible optoelectronic devices.

Materials Science in Semiconductor ProcessingVol. 218
Ritsumeikan University (JP)
Openalex Percentile: Top 23%
Chalcogenide Semiconductor Thin Films
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Low-temperature fabrication of TiO2 electron transport layers by solid-state electrochemical oxidation for selenium photovoltaics — Junji Murata, Taizo R. Kobayashi, et al. · Materials Science in Semiconductor Processing (2026) | TGRS Research Map | TGRS