A Regression Approach for Extending ASME V&V 20 Validation Metrics to Application Conditions ASME V&V 20 Writing Committee on Regression
Abstract Engineering simulations based on high fidelity mathematical models support safety, performance, and mission critical decisions in nuclear energy, aerospace, and defense. The ASME V&V 20 standard quantifies a range that bounds true model error for a scalar quantity of interest at discrete validation setpoints where experimental data exist. Because decisions are made at application points where direct experimental data are unavailable, a method is needed to extend model error knowledge from validation setpoints to application points for margin analyses. This article develops and analyzes a regression based procedure extending ASME V&V 20 scalar validation metrics from validation setpoints to application points within a validation space. The approach performs weighted polynomial regression on the upper and lower bounds of the V&V 20 modeling error interval, quantifies uncertainty from residual scatter and coefficient estimation, and propagates uncertainty to a selected application point. Numerical uncertainty at the application point is incorporated consistent with V&V 20, yielding a modeling error interval suitable for safety and performance margin assessments.
Authors
- Urmila Ghia
- Nima Fathi (ORCID: https://orcid.org/0000-0002-1555-6445)
- Laura Savoldi (ORCID: https://orcid.org/0000-0002-0267-2877)
- Joel Peltier
- Luís Eça (ORCID: https://orcid.org/0000-0001-8951-817X)
- Kevin J. Dowding
Institutions
- University of Lisbon (PT)
- Politecnico di Torino (IT)
- Bechtel (United States) (US)
- Sandia National Laboratories (US)
- Instituto Superior Técnico (PT)
- University of Cincinnati (US)
- Texas A&M University (US)
Publication Details
- Journal
- Journal of Verification Validation and Uncertainty Quantification
- Published
- 2026-10-08
- DOI
- https://doi.org/10.1115/1.4072747
- Primary Topic
- Probabilistic and Robust Engineering Design
- Type
- article
- Field-Weighted Citation Impact
- 0.00