Two successive frequency-locking intervals and pressure-induced jump readout via 1:1:1 internal resonance in electrically coupled molybdenum disulfide nanodrums
Amplitude-dependent frequency drift limits readout stability in nonlinear nanoelectromechanical resonators. We study two successive frequency-locking intervals in a reduced model of three electrically coupled molybdenum disulfide nanodrums near 1:1:1 internal resonance. The model includes directional coupling about the dc-biased equilibria and pressure-dependent frequency and damping. Stationary multiple-scale solutions are continued numerically and compared with a separately computed harmonic-balance response. The selected unlocking boundary sinφ1 = 1 is a limit of real stationary phase and does not imply vanishing intermodal energy transfer. For a no-jump operating point, a synthetic-drive-plus-300 K thermomechanical noise budget predicts a 76.9050% reduction in minimum Allan deviation relative to the uncoupled reference. Pressure continuation at fixed normalized drive resolves two successive downward jumps in the active-drum peak frequency. Joint adjustment of gate voltage and drive keeps the first jump near 10 Pa while tuning the second jump over a wider pressure range. An independent coupled-field finite-element calculation supports the electrical transfer pathway through a controlled comparison of connected and open ac branches. The finite-element assessment concerns small-signal transfer, while nonlinear locking is examined within the reduced-order model.
Authors
- Liang Ming He (ORCID: https://orcid.org/0000-0002-7402-9194)
- Dong F. Wang (ORCID: https://orcid.org/0000-0002-0921-2857)
- Hui Gou (ORCID: https://orcid.org/0000-0002-5898-4765)
- Cao Xia (ORCID: https://orcid.org/0000-0003-2819-7709)
- Wei Huang (ORCID: https://orcid.org/0000-0001-7708-4335)
- Yizhou Wang
- Jiaxin Miao
- Haoyu Duan
- Zhujie Zhao
- Yan Diao
Institutions
- Jilin University (CN)
- Sichuan University (CN)
- West China Hospital of Sichuan University (CN)
Publication Details
- Journal
- Journal of Applied Physics
- Published
- 2026-10-08
- DOI
- https://doi.org/10.1063/5.0351581
- Primary Topic
- Advanced MEMS and NEMS Technologies
- Type
- article
- Field-Weighted Citation Impact
- 0.00