Charge-Carrier Behavior and Molecular Interface Engineering in Perovskite Light-Emitting Diodes
Abstract Molecular interface engineering has become increasingly important for improving the efficiency and stability of perovskite light-emitting diodes (PeLEDs). Although highly emissive perovskite materials have advanced rapidly, their translation into high-performance devices remains limited by interfacial losses, unbalanced charge injection, and instability under electrical operation. In this review, we first discuss charge-carrier behavior in perovskite materials and devices, with emphasis on radiative and non-radiative recombination, carrier accumulation under injection, and the device-level consequences of interfacial constraints. We then examine the development of interfacial molecular strategies in PeLEDs, including self-assembled monolayers and related interfacial molecules, and summarize how such molecular layers influence charge injection, interfacial recombination, local electronic structure, and film formation at both charge-injection interfaces. On this basis, we further consider the implications of these interfacial effects for molecular regulation in light-emitting devices, with particular attention to electronic regulation under bias, chemically persistent passivation, and structural compatibility with emissive-layer formation. By connecting carrier physics, interfacial function, and molecular regulation, this review aims to provide a clearer framework for understanding and developing molecular interfacial strategies for high-performance PeLEDs.
Authors
- 方国家
- Fang Yao (ORCID: https://orcid.org/0000-0002-6096-5459)
- Akhtam Amonov (ORCID: https://orcid.org/0000-0002-5248-0881)
- Hong Tao (ORCID: https://orcid.org/0000-0003-0624-8026)
- Yongkang Tang
- Xiaojuan Cao
- Yao Chen
- Songzhan Li
Publication Details
- Journal
- Nano-Micro Letters
- Published
- 2026-10-07
- DOI
- https://doi.org/10.1007/s40820-026-02348-9
- Primary Topic
- Perovskite Materials and Applications
- Type
- article
- Field-Weighted Citation Impact
- 0.00