Frozen Epitaxial Strain in Complex Oxide Freestanding Membranes

Abstract Transition metal complex oxides exhibit a diverse array of emergent physical properties engineered through epitaxial strain. However, the interpretation of strain-driven phenomena is often obscured by structural modifications─particularly under in-plane tension─which can trigger unexpected departures from bulk behavior. Here, we report the observation of “frozen epitaxial strain” in complex oxide heterostructures, where epitaxial tensile strain induces a unit-cell volume expansion that remains locked even after complete substrate release. Using synchrotron X-ray diffraction, we quantify this irreversible structural response, demonstrating that the lattice fails to recover its bulk-like dimensions in the freestanding state. X-ray photoelectron spectroscopy and first-principles calculations reveal that this expansion is stabilized by a high density of tensile strain-promoted oxygen vacancies. These findings establish a fundamental link between epitaxial tension, defect chemistry, and structural “memory,” providing critical design rules for the controlled fabrication of functional freestanding membranes and strain-engineered oxide electronics.

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Publication Details

Journal
ACS Nano
Published
2026-10-05
DOI
https://doi.org/10.1021/acsnano.6c08965
Primary Topic
Electronic and Structural Properties of Oxides
Type
article
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article

Frozen Epitaxial Strain in Complex Oxide Freestanding Membranes

屠世浩, Tula R. Paudel, Varun Mapara, Hua Zhou et al.
ACS Nano
Electronic and Structural Properties of Oxides
article

Frozen Epitaxial Strain in Complex Oxide Freestanding Membranes

屠世浩, Tula R. Paudel, Varun Mapara, Hua Zhou, Paul Lenharth, Wuzhang Fang, Uwe Bergmann, Yuan Ping, Jason Ken Kawasaki, Chang‐Beom Eom, Yuchuan Yao, Pratap Pal, Ruiqi Sun, Peyton Burden
article en

Abstract

Abstract Transition metal complex oxides exhibit a diverse array of emergent physical properties engineered through epitaxial strain. However, the interpretation of strain-driven phenomena is often obscured by structural modifications─particularly under in-plane tension─which can trigger unexpected departures from bulk behavior. Here, we report the observation of “frozen epitaxial strain” in complex oxide heterostructures, where epitaxial tensile strain induces a unit-cell volume expansion that remains locked even after complete substrate release. Using synchrotron X-ray diffraction, we quantify this irreversible structural response, demonstrating that the lattice fails to recover its bulk-like dimensions in the freestanding state. X-ray photoelectron spectroscopy and first-principles calculations reveal that this expansion is stabilized by a high density of tensile strain-promoted oxygen vacancies. These findings establish a fundamental link between epitaxial tension, defect chemistry, and structural “memory,” providing critical design rules for the controlled fabrication of functional freestanding membranes and strain-engineered oxide electronics.

ACS Nano
Argonne National Laboratory (US), University of Wisconsin–Madison (US), South Dakota School of Mines and Technology (US)
Openalex Percentile: Top 27%
Electronic and Structural Properties of Oxides
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Frozen Epitaxial Strain in Complex Oxide Freestanding Membranes — 屠世浩, Tula R. Paudel, et al. · ACS Nano (2026) | TGRS Research Map | TGRS