A comparative assessment of electrical reliability in screen-printed nonwoven substrates: Evolon versus Tyvek

Abstract The structural integrity and electrical reliability of wearable electronics heavily depend on the physical properties of the underlying substrate. While previous research established a theoretical framework for modeling electrical degradation in specific printed nonwovens, this study expands that scope by providing a comprehensive comparative analysis of two distinct substrates: Evolon and Tyvek. Three silver-based conductive inks with different rheological characteristics (according to manufacturers’ data) were screen-printed onto both materials to evaluate their performance under the mechanical stress of repeated washing cycles. We applied a longitudinal damage model to quantify the progressive degradation of the transmission lines. The experimental findings reveal a significant contrast in failure mechanisms dictated by the substrate’s architecture. Although Tyvek exhibited lower initial Direct Current (DC) resistance, the printed circuits on this substrate suffered catastrophic electrical failure during the washing tests. Conversely, the porous, hydro-entangled structure of Evolon facilitated better ink integration, resulting in a measurable, progressive damage evolution that depended on the ink formulation. This comparative assessment underscores the critical role of substrate-ink compatibility in maintaining electrical stability and provides a predictive approach for designing durable, washable e-textiles.