Exact Dice Degradation Envelopes for Label-Free Segmentation Update Selection

Test-time segmentation updates can improve an unlabeled input while damaging another. Confidence and transformation consistency can rank candidates, but do not in themselves bound the loss caused by returning a changed mask. We derive the exact largest decrease in binary Dice between a baseline and a candidate, maximized over every possible unknown reference mask on the same pixels. A maximizing reference always lies inside baseline foreground: three observable mask counts reduce the problem to at most four reference-cardinality checks. Accepting an output only when its envelope is below a budget gives a deterministic, per-case Dice degradation limit relative to the baseline. A finite grid of logit interpolations permits partial candidate outputs without extra network forwards. Exhaustive and randomized validation checks 5,026,592 reference masks with no discrepancy. We evaluate six independently trained MK-UNet sources, three seeds per task, on ClinicDB, Massachusetts Buildings and the external Kvasir-SEG cohort, including appearance corruptions. Across 17,808 case-condition-seed evaluations, 0 certificate violations occur in the checked candidate comparisons. At a one-point Dice budget, exact versus loose interpolation changes the returned mask in the following fractions of episodes: ClinicDB, 51.0% versus 38.7%; Buildings, 62.1% versus 53.1%; Kvasir-SEG, 52.3% versus 34.9%. Mean Dice effects and useful-update rejection are reported separately from admissibility. An exploratory oracle-presence-bit ablation examines how weak supervision relaxes the empty-baseline restriction. The envelope quantifies relative mask-change risk; it does not certify anatomical correctness, preserve other metrics, or guarantee adaptation benefit.

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Publication Details

Journal
Zenodo (CERN European Organization for Nuclear Research)
Published
2026-09-30
DOI
https://doi.org/10.5281/zenodo.23067851
Primary Topic
Advanced Neural Network Applications
Type
preprint
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Exact Dice Degradation Envelopes for Label-Free Segmentation Update Selection

Yuvraj Verma
Zenodo (CERN European Organization for Nuclear Research)
Advanced Neural Network Applications
preprint

Exact Dice Degradation Envelopes for Label-Free Segmentation Update Selection

Yuvraj Verma
preprint en

Abstract

Test-time segmentation updates can improve an unlabeled input while damaging another. Confidence and transformation consistency can rank candidates, but do not in themselves bound the loss caused by returning a changed mask. We derive the exact largest decrease in binary Dice between a baseline and a candidate, maximized over every possible unknown reference mask on the same pixels. A maximizing reference always lies inside baseline foreground: three observable mask counts reduce the problem to at most four reference-cardinality checks. Accepting an output only when its envelope is below a budget gives a deterministic, per-case Dice degradation limit relative to the baseline. A finite grid of logit interpolations permits partial candidate outputs without extra network forwards. Exhaustive and randomized validation checks 5,026,592 reference masks with no discrepancy. We evaluate six independently trained MK-UNet sources, three seeds per task, on ClinicDB, Massachusetts Buildings and the external Kvasir-SEG cohort, including appearance corruptions. Across 17,808 case-condition-seed evaluations, 0 certificate violations occur in the checked candidate comparisons. At a one-point Dice budget, exact versus loose interpolation changes the returned mask in the following fractions of episodes: ClinicDB, 51.0% versus 38.7%; Buildings, 62.1% versus 53.1%; Kvasir-SEG, 52.3% versus 34.9%. Mean Dice effects and useful-update rejection are reported separately from admissibility. An exploratory oracle-presence-bit ablation examines how weak supervision relaxes the empty-baseline restriction. The envelope quantifies relative mask-change risk; it does not certify anatomical correctness, preserve other metrics, or guarantee adaptation benefit.

Zenodo (CERN European Organization for Nuclear Research)
Indian Institute of Technology Madras (IN)
Peace, Justice and strong institutions
Advanced Neural Network Applications
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Exact Dice Degradation Envelopes for Label-Free Segmentation Update Selection — Yuvraj Verma · Zenodo (CERN European Organization for Nuclear Research) (2026) | TGRS Research Map | TGRS