Planar mmWave near-field antenna measurement system with multiple probes
Abstract Planar near-field (NF) scanners are an essential tool to measure and characterize antennas. Their compact design and simple operation principle give them an advantage over classical far-field systems. This work presents a compact planar mmWave scanner, which implements an active probe array to achieve better and faster scans. The scanner architecture and the necessary steps to align the NF samples are discussed with a special focus on a novel concept to implement a probe compensation algorithm for multiple probes using a calibration antenna.
Authors
- Dirk Plettemeier (ORCID: https://orcid.org/0000-0001-8229-3932)
- Thomas Deckert (ORCID: https://orcid.org/0009-0001-9831-5531)
- Marc Vanden Bossche (ORCID: https://orcid.org/0000-0002-4844-6568)
- Martin Obermaier (ORCID: https://orcid.org/0000-0002-1884-7088)
- Johannes Lange (ORCID: https://orcid.org/0000-0001-7513-6330)
Institutions
- Emerson School District (US)
- Technische Universität Dresden (DE)
- Emerson (Sweden) (SE)
Publication Details
- Journal
- International Journal of Microwave and Wireless Technologies
- Published
- 2026-09-28
- DOI
- https://doi.org/10.1017/s1759078726103808
- Primary Topic
- Electromagnetic Compatibility and Measurements
- Type
- article
- Field-Weighted Citation Impact
- 0.00