Single-Domain Orbital Angular Momentum Mapping: Advancing Photoemission Dichroism to the Nanoscale

Abstract Circular dichroism in angle-resolved photoemission spectroscopy (CD-ARPES) is widely used to probe orbital angular momentum (OAM) and Berry-curvature-related phenomena in two-dimensional quantum materials. However, in many materials, conventional micron-scale measurements often average over domains with opposite OAM polarization, canceling intrinsic dichroic signals and leaving spectra dominated by extrinsic asymmetries arising from photoelectron final-state interference. Here, we combine circularly polarized light with NanoARPES to achieve spatially resolved CD-ARPES with sub-800 nm resolution. By isolating individual domains, this approach enables direct access to the intrinsic OAM texture. As a model system, we investigate the K/K′ point valley states of the quantum spin Hall insulator indenene─a triangular indium monolayer epitaxially grown on SiC(0001)─where substrate-induced terraces host alternating valley configurations whose dichroic response is averaged out in conventional measurements. Terrace-resolved NanoARPES disentangles these contributions, allowing direct visualization of oppositely polarized domains and revealing the OAM texture associated with a topological band inversion. Our results establish spatially resolved CD-ARPES as a robust approach for isolating intrinsic OAM contrast by eliminating domain averaging and correcting for extrinsic geometry-dependent contributions. This enables direct access to the Berry curvature near the Fermi level, providing a powerful probe of the system’s intrinsic topological character.

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Publication Details

Journal
ACS Nano
Published
2026-10-06
DOI
https://doi.org/10.1021/acsnano.6c11101
Primary Topic
Electron and X-Ray Spectroscopy Techniques
Type
article
Field-Weighted Citation Impact
0.00

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article

Single-Domain Orbital Angular Momentum Mapping: Advancing Photoemission Dichroism to the Nanoscale

Jonas Erhardt, Hanbo Xiao, Giorgio Sangiovanni, 刘忠凯 Zhongkai Liu et al.
ACS Nano
Electron and X-Ray Spectroscopy Techniques
article

Single-Domain Orbital Angular Momentum Mapping: Advancing Photoemission Dichroism to the Nanoscale

Jonas Erhardt, Hanbo Xiao, Giorgio Sangiovanni, 刘忠凯 Zhongkai Liu, Matthew D. Watson, R. Claessen, Simon Moser, Kilian Strauss, Cédric Schmitt, Gang Li, Han Gao, J. Schäfer, Lukas Gehrig, Bing Liu, Merit Spring
article en

Abstract

Abstract Circular dichroism in angle-resolved photoemission spectroscopy (CD-ARPES) is widely used to probe orbital angular momentum (OAM) and Berry-curvature-related phenomena in two-dimensional quantum materials. However, in many materials, conventional micron-scale measurements often average over domains with opposite OAM polarization, canceling intrinsic dichroic signals and leaving spectra dominated by extrinsic asymmetries arising from photoelectron final-state interference. Here, we combine circularly polarized light with NanoARPES to achieve spatially resolved CD-ARPES with sub-800 nm resolution. By isolating individual domains, this approach enables direct access to the intrinsic OAM texture. As a model system, we investigate the K/K′ point valley states of the quantum spin Hall insulator indenene─a triangular indium monolayer epitaxially grown on SiC(0001)─where substrate-induced terraces host alternating valley configurations whose dichroic response is averaged out in conventional measurements. Terrace-resolved NanoARPES disentangles these contributions, allowing direct visualization of oppositely polarized domains and revealing the OAM texture associated with a topological band inversion. Our results establish spatially resolved CD-ARPES as a robust approach for isolating intrinsic OAM contrast by eliminating domain averaging and correcting for extrinsic geometry-dependent contributions. This enables direct access to the Berry curvature near the Fermi level, providing a powerful probe of the system’s intrinsic topological character.

ACS Nano
Bielefeld University (DE), University of Würzburg (DE), ShanghaiTech University (CN), Research Complex at Harwell (GB), Ruhr University Bochum (DE)
Deutsche Forschungsgemeinschaft
Openalex Percentile: Top 34%
Electron and X-Ray Spectroscopy Techniques
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