Interface-selected terahertz polarity switching in Cr-based spintronic heterostructures
Spintronic terahertz (THz) emission is a powerful probe of ultrafast spin and orbital angular-momentum transport in magnetic heterostructures. Here, we demonstrate interface-selected THz polarity switching in Ni/Permalloy (Py)/Cr trilayers. Ni/Cr and Py/Cr bilayers emit THz pulses with opposite polarity, indicating two distinct Cr-mediated conversion channels. This contrast is attributed to Py-dominated spin-current-induced inverse spin Hall conversion and Ni-mediated orbital-related inverse orbital Hall conversion, which have opposite effective signs in Cr. By constructing Ni/Py/Cr and Py/Ni/Cr trilayers, we show that the THz response cannot be explained by a simple superposition of Ni- and Py-related ferromagnetic (FM) contributions. Instead, the polarity is selected by the local FM/Cr interface. A clear polarity reversal occurs when an ultrathin Ni or Py layer of only 0.5–1 nm is inserted at the Cr interface, revealing the critical role of early-stage interface formation. Our results establish an interface-engineering route for controlling THz polarity through competing spin and orbital conversion channels in Cr-based spintronic emitters.
Authors
- Jia Xu (ORCID: https://orcid.org/0000-0001-6991-9013)
- Hao Meng (ORCID: https://orcid.org/0000-0003-0372-8817)
- Tong Fu (ORCID: https://orcid.org/0000-0001-8812-4515)
- Yuxi Guo (ORCID: https://orcid.org/0000-0002-5761-587X)
- Chao Zhou (ORCID: https://orcid.org/0000-0002-6873-6140)
- Xianguo Jiang
- Wendeng Huang (ORCID: https://orcid.org/0000-0002-4522-2884)
- Xintong Zu (ORCID: https://orcid.org/0009-0005-4907-2579)
- Lei Hao
- Xuan Yang
- Ning Yang
- Shaohua Zhang (ORCID: https://orcid.org/0009-0007-0839-5210)
- Yaxuan Jin (ORCID: https://orcid.org/0009-0008-2649-0091)
- Chao Lu
Institutions
- Shaanxi University of Technology (CN)
Publication Details
- Journal
- Applied Physics Letters
- Published
- 2026-09-14
- DOI
- https://doi.org/10.1063/5.0347610
- Primary Topic
- Magnetic properties of thin films
- Type
- article
- Field-Weighted Citation Impact
- 0.00