An attention-guided dual-branch global–local deep learning framework for multiclass surface defect classification in steel billets

Automated inspection of surface defects in steel billet cross-sections is challenging in industrial production lines because of high processing speeds, illumination variations, thermal reflections, and imbalanced defect classes. This study proposes a Grad-CAM-guided dual-branch Global–Local deep learning framework for multiclass billet defect classification. In the proposed architecture, a global branch processes the entire image to extract structural and contextual representations, whereas Grad-CAM attention maps generated from a target convolutional layer automatically localize the most discriminative region of interest. The localized region is then analyzed by a local branch to capture fine-grained texture patterns and subtle defect-related features. Global and local representations are fused through feature concatenation and fed to a classification head for final prediction. The dataset consists of real billet cross-section images acquired from the production line of Khuzestan Steel Company and includes seven categories: six defect types and one healthy class. An embedded hardware platform was also developed to enable real-time deployment and automatic marking of defective billets under harsh industrial conditions. Robustness and generalization were evaluated using stratified 5-fold cross-validation with MobileNetV2, ResNet50, and DenseNet121 backbones. ResNet50 achieved the best performance, with 93.05% accuracy and a macro AUC of 0.9888, while MobileNetV2 remained suitable for resource-constrained deployment.

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Publication Details

Journal
Scientific Reports
Published
2026-09-11
DOI
https://doi.org/10.1038/s41598-026-71035-x
Primary Topic
Industrial Vision Systems and Defect Detection
Type
article
Field-Weighted Citation Impact
0.00

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article

An attention-guided dual-branch global–local deep learning framework for multiclass surface defect classification in steel billets

Gholamreza Akbarizadeh, Zohoor Hayali, Karim Ansari Asl, Alireza Hamadi Salemi
Scientific Reports
Industrial Vision Systems and Defect Detection
article

An attention-guided dual-branch global–local deep learning framework for multiclass surface defect classification in steel billets

Gholamreza Akbarizadeh, Zohoor Hayali, Karim Ansari Asl, Alireza Hamadi Salemi
article en

Abstract

Automated inspection of surface defects in steel billet cross-sections is challenging in industrial production lines because of high processing speeds, illumination variations, thermal reflections, and imbalanced defect classes. This study proposes a Grad-CAM-guided dual-branch Global–Local deep learning framework for multiclass billet defect classification. In the proposed architecture, a global branch processes the entire image to extract structural and contextual representations, whereas Grad-CAM attention maps generated from a target convolutional layer automatically localize the most discriminative region of interest. The localized region is then analyzed by a local branch to capture fine-grained texture patterns and subtle defect-related features. Global and local representations are fused through feature concatenation and fed to a classification head for final prediction. The dataset consists of real billet cross-section images acquired from the production line of Khuzestan Steel Company and includes seven categories: six defect types and one healthy class. An embedded hardware platform was also developed to enable real-time deployment and automatic marking of defective billets under harsh industrial conditions. Robustness and generalization were evaluated using stratified 5-fold cross-validation with MobileNetV2, ResNet50, and DenseNet121 backbones. ResNet50 achieved the best performance, with 93.05% accuracy and a macro AUC of 0.9888, while MobileNetV2 remained suitable for resource-constrained deployment.

Scientific Reports
Shahid Chamran University of Ahvaz (IR)
Shahid Chamran University of Ahvaz
Openalex Percentile: Top 11%
Industrial Vision Systems and Defect Detection
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