A Static, Multisubstrate, In Silico Reactor Design of the MOCVD Process for Uniform Growth of GaN Epitaxial Layers

Abstract Gallium nitride (GaN) epitaxial film properties depend critically on deposition uniformity and growth efficiency. While metal-organic chemical vapor deposition (MOCVD) is the dominant industrial technology, traditional vertical rotating disk reactors generate complex centrifugal fields, edge vortices, and gas short-circuiting. These flow instabilities degrade film purity, limit precursor utilization, and complicate process control, creating bottlenecks for large-scale, high-throughput integration. To address these limitations, a novel, rotation-free MOCVD reactor architecture designed for high-capacity batch scale-up is proposed. By eliminating the high-speed rotating susceptor (core moving component of traditional MOCVD) and adopting advanced structural flow control, the proposed static chamber accommodates six symmetrically arranged stationary substrates, which removes centrifugal flow disturbances induced by mechanical rotation. The system utilizes 12 independently distributed annular inlets to deliver trimethylgallium (TMGa) and ammonia (NH3) isolated by inert carrier gases (H2/N2), successfully eliminating gas-phase prereactions at the source. Such units can be stacked up to increase throughput. Using an experimentally validated 3D multiphysics coupled model, the chamber height and exhaust outlet layout were optimized to suppress parasitic vortices. Numerical simulations demonstrate that the optimized design (75 mm chamber height) dramatically improves growth uniformity (GU) by 77.4% (from 0.04746 to 0.01074) compared to traditional rotating systems, while slightly increasing the average growth rate (GR) to 0.4774 μm/h. Furthermore, process parameter optimization (V/III ratio = 700, substrate temperature = 1373 K) enhances the growth rate to 0.509 μm/h while maintaining excellent uniformity. This rotation-free, multisubstrate design strategy offers a highly stable, low-complexity framework for next-generation, high-throughput semiconductor manufacturing equipment.

Authors

Institutions

Publication Details

Journal
ACS Engineering Au
Published
2026-09-10
DOI
https://doi.org/10.1021/acsengineeringau.6c00043
Primary Topic
GaN-based semiconductor devices and materials
Type
article
Field-Weighted Citation Impact
0.00
Controls
|||
ALL TIME
JAN
FEB
MAR
APR
MAY
JUN
JUL
AUG
SEP
OCT
article

A Static, Multisubstrate, In Silico Reactor Design of the MOCVD Process for Uniform Growth of GaN Epitaxial Layers

Chengmin Chen, 游昊龙, K. Nandakumar, Lei Zhang et al.
ACS Engineering Au
GaN-based semiconductor devices and materials
article

A Static, Multisubstrate, In Silico Reactor Design of the MOCVD Process for Uniform Growth of GaN Epitaxial Layers

Chengmin Chen, 游昊龙, K. Nandakumar, Lei Zhang, Jianzhi Li, Feipeng Cai
article en

Abstract

Abstract Gallium nitride (GaN) epitaxial film properties depend critically on deposition uniformity and growth efficiency. While metal-organic chemical vapor deposition (MOCVD) is the dominant industrial technology, traditional vertical rotating disk reactors generate complex centrifugal fields, edge vortices, and gas short-circuiting. These flow instabilities degrade film purity, limit precursor utilization, and complicate process control, creating bottlenecks for large-scale, high-throughput integration. To address these limitations, a novel, rotation-free MOCVD reactor architecture designed for high-capacity batch scale-up is proposed. By eliminating the high-speed rotating susceptor (core moving component of traditional MOCVD) and adopting advanced structural flow control, the proposed static chamber accommodates six symmetrically arranged stationary substrates, which removes centrifugal flow disturbances induced by mechanical rotation. The system utilizes 12 independently distributed annular inlets to deliver trimethylgallium (TMGa) and ammonia (NH3) isolated by inert carrier gases (H2/N2), successfully eliminating gas-phase prereactions at the source. Such units can be stacked up to increase throughput. Using an experimentally validated 3D multiphysics coupled model, the chamber height and exhaust outlet layout were optimized to suppress parasitic vortices. Numerical simulations demonstrate that the optimized design (75 mm chamber height) dramatically improves growth uniformity (GU) by 77.4% (from 0.04746 to 0.01074) compared to traditional rotating systems, while slightly increasing the average growth rate (GR) to 0.4774 μm/h. Furthermore, process parameter optimization (V/III ratio = 700, substrate temperature = 1373 K) enhances the growth rate to 0.509 μm/h while maintaining excellent uniformity. This rotation-free, multisubstrate design strategy offers a highly stable, low-complexity framework for next-generation, high-throughput semiconductor manufacturing equipment.

ACS Engineering Au
Louisiana State University System (US), Louisiana State University (US), Qilu University of Technology (CN), Shandong University (CN)
Industry, innovation and infrastructure
Openalex Percentile: Top 16%
GaN-based semiconductor devices and materials
AI Navigator

Ask Laika to Summarize, Analyze, and Connect papers live on the map.

Summarize Papers & Methodologies

Extract key findings, datasets, and comparative methods across publications.

Benchmark Rankings & Visual Analytics

Rank top research institutions, authors, funders, topics, and journals by Field-Weighted Citation Impact (FWCI) and paper volume with instant charts.

Connect Distant Disciplines

Bridge topological clusters on the map to find hidden collaborative intersections.