Robust Ordered-Risk Assessment via Physics-Informed Synthetic Data Generation and TA-DE-ELM
Ordered-risk assessment is a safety-critical learning problem in which delayed or biased risk estimation can affect prioritization and response planning. Existing expert-knowledge and data-driven approaches face a trade-off among transparent indicator design, nonlinear representation capability, and stable optimization when reliable labeled data are scarce. To address this gap, we developed a two-stage adaptive differential evolution-optimized extreme learning machine framework (TA-DE-ELM) for six-level ordered-risk assessment and evaluated it in a controlled physics-informed synthetic simulation benchmark. The benchmark encodes kinematic, capability, sensing/interference, and resilience priors as explicit scoring rules for model evaluation, rather than as an application simulator. The method combines transparent risk-logic specification, a stage-wise exploration–refinement optimizer with stagnation-triggered restart, and a validation objective that jointly considers cross-entropy, macro-F1, ordinal error, and accuracy. Under a unified finite budget, TA-DE-ELM ranked first among all tested ELM-family baselines for accuracy, macro-F1, quadratic weighted kappa, and ordinal mean absolute error, with paired tests indicating improvements over the closest competitor (p<0.013). These results show that TA-DE-ELM can recover an expert-rule-induced ordered-risk mapping more effectively than the tested baselines under controlled finite-sample conditions. Further validation with higher-fidelity simulators, externally collected datasets, and richer temporal perturbation protocols remains necessary before application-specific use.
Authors
- Yuming Bo (ORCID: https://orcid.org/0000-0002-7508-5083)
- X Liu (ORCID: https://orcid.org/0009-0006-3912-5224)
- Panlong Wu (ORCID: https://orcid.org/0000-0002-1177-4250)
- Chunhao Liu (ORCID: https://orcid.org/0000-0003-2332-8984)
- Feng Lei Huang (ORCID: https://orcid.org/0000-0002-2277-4360)
- Siliang Yang
Institutions
- Shanghai University of Engineering Science (CN)
- Nanjing University of Science and Technology (CN)
Publication Details
- Journal
- Electronics
- Published
- 2026-09-09
- DOI
- https://doi.org/10.3390/electronics15184078
- Primary Topic
- Machine Learning and ELM
- Type
- article
- Field-Weighted Citation Impact
- 0.00