Attribute control charts for the compound Weibull-exponential distribution under truncated life tests

This study develops an attribute np control chart for monitoring the number of failures under truncated life tests using a single-sampling inspection plan, assuming that product lifetimes follow the Compound Weibull-Exponential (CWE) distribution. The control chart parameters are determined for various quality levels and specified in-control average run length (ARL0) values through an iterative design procedure. To provide a more comprehensive assessment of chart performance, the proposed scheme is evaluated using the Average Run Length (ARL1), Standard Deviation of the Run Length (SDRL), Expected Average Run Length (EARL), and Expected Quadratic Loss (EQL). Numerical tables are presented for different combinations of the shape parameter, sample size, specified ARL0, and process shift values. In addition, a Monte Carlo simulation study is conducted to demonstrate the performance of the proposed control chart for monitoring defective items.