Packaging Design and Simulation-Guided Multi-Domain Design Refinement of a High-Density Integrated RF Microsystem Based on an ABF Substrate
With the increasing demand for miniaturization, multi-channel RF transceiver capability, and high-speed digital processing in unmanned aerial vehicles, satellite remote sensing, and anti-jamming communication systems, conventional board-level discrete integration schemes face significant limitations in terms of interconnect length, parasitic effects, volume and weight, and electromagnetic compatibility. This paper proposes a high-density integrated RF microsystem packaging scheme based on a 12-layer ABF organic substrate. Within a package size of 37.5 mm × 37.5 mm, the microsystem integrates a digital processing chip, two DDR3 memories, two Flash memories, two broadband RF transceiver chips, and passive components, thereby realizing a 4-receiver/4-transmitter MIMO architecture. Compared with a conventional discrete PCB-based integration scheme, the proposed microsystem reduces the board-level occupied area by approximately 70% and decreases the weight by more than 30%. To address the non-reworkable nature of the in-package DDR3 address/command/clock links and their sensitivity to high-speed signal integrity, a field-circuit co-simulation method combining three-dimensional electromagnetic S-parameter extraction with IBIS models is adopted to optimize the transmission-line impedance and termination parameters under a fly-by topology. The results show that by optimizing the DDR3 clock-line impedance from the conventional 100 Ω differential impedance to 80 Ω differential impedance, and the address/control-line impedance from the conventional 50 Ω single-ended impedance to 40 Ω single-ended impedance, together with 40 Ω and 120 Ω terminations, respectively, overshoot and ringing can be effectively suppressed. The DDR3 eye width is improved from 0.89 ns to 0.92 ns. To address impedance discontinuities in the vertical interconnects of RF channels, a refined structure combining enlarged antipads and accompanying ground vias is proposed. As a result, the worst-case return loss of the RF channel is improved from below 16 dB to 19.69 dB, the maximum insertion loss is reduced from above 0.5 dB to 0.35 dB, and the worst-case inter-channel isolation is improved from below 60 dB to 73.42 dB. To mitigate thermal coupling and localized thermal isolation caused by thickness differences among multiple chips, a locally recessed copper heat spreader is designed, reducing the junction-to-case thermal resistance of the RF chip from 1.25 °C/W to 0.50 °C/W, corresponding to a reduction of approximately 60%. Preliminary hardware-in-the-loop frequency-hopping tests based on the proposed microsystem demonstrate that the system can achieve an analog frequency-hopping rate exceeding 4000 hops/s and a hybrid frequency-hopping rate exceeding 10,000 hops/s. The results indicate that the proposed packaging scheme provides a feasible engineering implementation path for high-density, multi-channel RF microsystem design.
Authors
- He Chen (ORCID: https://orcid.org/0000-0001-6356-1655)
- Guoliang Zhu (ORCID: https://orcid.org/0000-0001-5035-4489)
- Xuan Liu
- Yu Yan
- Feng Liu
- Jinjian Zhang
- Guojun Wang
Institutions
- Beijing Institute of Technology (CN)
- Northwestern Polytechnical University (CN)
Publication Details
- Journal
- Electronics
- Published
- 2026-09-01
- DOI
- https://doi.org/10.3390/electronics15173926
- Primary Topic
- 3D IC and TSV technologies
- Type
- article
- Field-Weighted Citation Impact
- 0.00