Practical Guide to Analyzing Dynamics Using X-ray Photon Correlation Spectroscopy (XPCS)

X-ray photon correlation spectroscopy (XPCS) provides access to nanoscale dynamics, yet practical approaches for interpreting its data remain limited. This tutorial presents a systematic framework for XPCS data analysis, illustrated using measurements performed at the NSLS-II CHX beamline. The fundamental concepts of speckle pattern and the intensity autocorrelation function are introduced, followed by ferroelectric case studies demonstrating how polarization switching and phase transition dynamics can be extracted from XPCS measurements. The influence of the probed q-range experimental conditions such as X-ray transmittance is examined for data interpretation. These elements are consolidated into practical guidelines for the reliable analysis of XPCS data.