Spiers Memorial Lecture: Emerging semiconductors viewed through the lens of a scanning electron microscope
As new materials are developed, or as their applications develop, it is important to have a range of characterisation techniques to understand their properties with a view to improving their...
Authors
- Robert Martin
Publication Details
- Journal
- Faraday Discussions
- Published
- 2026-08-27
- DOI
- https://doi.org/10.1039/d6fd00115g
- Primary Topic
- Electron and X-Ray Spectroscopy Techniques
- Type
- article
- Field-Weighted Citation Impact
- 0.00
Funders
- Royal Society of Chemistry
- Engineering and Physical Sciences Research Council