Sub-bandgap photoluminescence and defect-controlled transport in layered Cu3In5S9 single crystals
Abstract High-quality Cu 3 In 5 S 9 single crystals were grown by the Bridgman method and systematically investigated to correlate structural order, defect-related vibrational features, charge transport, and sub-bandgap optical response. X-ray diffraction revealed a highly crystalline monoclinic structure with well-defined reflections, while energy-dispersive X-ray spectroscopy verified the presence of Cu, In, and S as the constituent elements of the crystal. Raman spectroscopy revealed a dominant first-order phonon mode at 288.9 cm -1 , accompanied by Cu–S and In–S vibrational features in the 200–350 cm -1 range, while FTIR spectra exhibited characteristic metal–sulfur stretching bands in the 400–600 cm -1 region. Near-infrared (NIR) absorption measurements revealed a pronounced absorption edge in this spectral range, and Tauc analysis confirmed a direct optical band gap of approximately 1.43 eV. A weak sub-bandgap absorption tail indicates the presence of defect-related localized states, which are likely to influence the charge-transport behavior. Temperature-dependent Hall measurements revealed two distinct mobility regimes: the mobility increases with temperature (μ h ∝ T +3/2 ) in the 150–250 K range, consistent with ionized-impurity scattering, whereas it decreases with increasing temperature in the 270–370 K range, indicating a crossover to phonon-limited transport. The crystals exhibit pronounced photoluminescence under sub-bandgap excitation at 1064 nm, providing clear evidence of a nonlinear excitation pathway consistent with two-photon absorption. The two-photon absorption coefficient is estimated to be approximately 6 × 10 -2 cm -1 . These results establish Cu 3 In 5 S 9 as a structurally ordered layered semiconductor exhibiting coupled defect-mediated transport and nonlinear optical response, highlighting its potential for near-infrared optoelectronic and multiphoton applications.
Authors
- Lamiya Balayeva (ORCID: https://orcid.org/0009-0004-1725-9163)
- Fidan Ahmadova
- Ali Guseinov
- Ugur Deneb Menda
- Hugo Águas
Institutions
- Baku State University (AZ)
- Universidade Nova de Lisboa (PT)
Publication Details
- Journal
- Journal of Materials Science Materials in Engineering
- Published
- 2026-08-27
- DOI
- https://doi.org/10.1186/s40712-026-00576-w
- Primary Topic
- Chalcogenide Semiconductor Thin Films
- Type
- article
- Field-Weighted Citation Impact
- 0.00