PRISM: Feature-Guided Hierarchical Inpainting for Dual-Band Infrared Defective Pixel Clusters
This paper presents a feature-level defective pixel cluster (DPC) correction method specifically designed for dual-band infrared detectors. Due to inherent manufacturing limitations, antimonide-based type-II superlattice (T2SL) focal plane arrays (FPAs) commonly suffer from DPC issues. Existing DPC correction methods often fail to preserve dual-band imaging characteristics, leading to texture distortion and incomplete structure recovery. Inspired by infrared imaging mechanisms and image inpainting theory, we propose PRISM, a patch-based reconstruction framework that leverages inter-band structure migration with hierarchical feature decomposition, decoupling dual-band images into micro-textures, edge gradients, and spatial relationships. Leveraging this multi-level feature representation, we extract prior information to guide DPC correction. The correction process is formulated as a “structure-to-pixel” optimization problem, where an improved feature-guided patch search strategy effectively combines structure completion with texture reconstruction. Experimental results demonstrate that the proposed method not only recovers image content effectively but also faithfully preserves band-specific imaging characteristics. Furthermore, to facilitate quantitative evaluation, we construct a benchmark dataset containing simulated DPCs with corresponding ground truth. Comparative experiments on both our self-constructed dataset and public multimodal benchmarks confirm that PRISM achieves higher PSNR, SSIM, VIF, and CC metrics than state-of-the-art multimodal inpainting methods.
Authors
- Xiaoli Xi (ORCID: https://orcid.org/0000-0002-7242-5695)
- Jinxin Wang (ORCID: https://orcid.org/0000-0003-4205-7673)
- Dongmei Li (ORCID: https://orcid.org/0000-0002-2598-657X)
- Xu Zhao (ORCID: https://orcid.org/0009-0002-7058-4323)
- Fang Li
- Dongwei Jiang
- Yingqiang Xu
- Hongyue Hao
Institutions
- Chinese Academy of Sciences (CN)
- Institute of Semiconductors (CN)
- University of Chinese Academy of Sciences (CN)
Publication Details
- Journal
- Sensors
- Published
- 2026-08-27
- DOI
- https://doi.org/10.3390/s26175417
- Primary Topic
- Infrared Target Detection Methodologies
- Type
- article
- Field-Weighted Citation Impact
- 0.00