Femtosecond laser-based surface gold removal and its applications in flip chip bonding

Femtosecond laser processing was utilized to thin Au platings from 3.0 μm to 0.3 μm. This study investigated the effects of processing parameters on thinning quality. Results demonstrate that laser processing significantly improves solder wettability, achieving an average spreading coefficient above 95%. It also homogenizes solder joint composition and effectively controls intermetallic compound (IMC) growth, reducing its thickness by over 75% after 500 h of aging. The process suppresses brittle Pb-rich layer formation and curbs void growth, maintaining a void ratio below 1.0% and doubling the shear load after aging. Fracture analysis confirms maintained ductility. This study demonstrates a femtosecond-laser-based localized interfacial engineering strategy for thick-Au pads, in which localized Au reduction primarily suppresses excessive Au–Sn interfacial reactions, while the laser-induced micro-groove topology improves solder spreading and local interfacial contact.

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Publication Details

Journal
Advanced Materials Joining
Published
2026-08-26
DOI
https://doi.org/10.1007/s44500-026-00019-8
Primary Topic
Electronic Packaging and Soldering Technologies
Type
article
Field-Weighted Citation Impact
0.00

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article

Femtosecond laser-based surface gold removal and its applications in flip chip bonding

Dasen Wang, Zhongquan Qu, Xiaopeng Li, Weiyi Kong et al.
Advanced Materials Joining
Electronic Packaging and Soldering Technologies
article

Femtosecond laser-based surface gold removal and its applications in flip chip bonding

Dasen Wang, Zhongquan Qu, Xiaopeng Li, Weiyi Kong, Yuxuan Li, Kehong Wang, Yong Peng
article en

Abstract

Femtosecond laser processing was utilized to thin Au platings from 3.0 μm to 0.3 μm. This study investigated the effects of processing parameters on thinning quality. Results demonstrate that laser processing significantly improves solder wettability, achieving an average spreading coefficient above 95%. It also homogenizes solder joint composition and effectively controls intermetallic compound (IMC) growth, reducing its thickness by over 75% after 500 h of aging. The process suppresses brittle Pb-rich layer formation and curbs void growth, maintaining a void ratio below 1.0% and doubling the shear load after aging. Fracture analysis confirms maintained ductility. This study demonstrates a femtosecond-laser-based localized interfacial engineering strategy for thick-Au pads, in which localized Au reduction primarily suppresses excessive Au–Sn interfacial reactions, while the laser-induced micro-groove topology improves solder spreading and local interfacial contact.

Advanced Materials JoiningVol. 1(1)
China Electronics Technology Group Corporation (CN), China North Industries Group Corporation (China) (CN), Nanjing University of Science and Technology (CN), Institute of Electronics (CN), Nanjing Hydraulic Research Institute (CN)
National Natural Science Foundation of China
Openalex Percentile: Top 19%
Electronic Packaging and Soldering Technologies
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