Digit-Cycle Recurrence (DCR): Maximum Period, Ring-Theoretic Properties, and Deterministic Hardware Primitives

### SummaryThis paper presents a revised algebraic formalization of the Digit-Cycle Recurrence (DCR), a linear recurrence transformation defined over integer rings (Z/bZ)^n. We establish the exact Maximum Period Theorem for arbitrary composite bases b = ∏ p_i^(a_i) and digit length n ≥ 2, correcting previous estimations for prime power factors. Furthermore, we re-evaluate the hardware utility of DCR for lightweight Built-In Self-Test (BIST) pattern generation and deterministic sequence testing in integrated circuits.### Key Contributions* **Exact Order Theorem:** Proves the exact maximum period formula P_max(n, b) = b · ∏ p_i^⌊log_{p_i}(n-1)⌋ over general composite rings.* **Correction of Prior Discrepancies:** Resolves order calculation oversights for prime power components.* **Hardware Re-positioning:** Re-evaluates DCR from cryptographic PRNGs toward deterministic Memory BIST and logic test pattern generation.### Revision Note (v2)This updated version includes the finalized algebraic proofs, corrected matrix notation, and updated period validation tables.

Authors

Publication Details

Journal
Zenodo (CERN European Organization for Nuclear Research)
Published
2026-08-24
DOI
https://doi.org/10.5281/zenodo.22079877
Primary Topic
VLSI and Analog Circuit Testing
Type
preprint
Controls
|||
ALL TIME
JAN
FEB
MAR
APR
MAY
JUN
JUL
AUG
SEP
OCT
preprint

Digit-Cycle Recurrence (DCR): Maximum Period, Ring-Theoretic Properties, and Deterministic Hardware Primitives

Seon-Woo Park
Zenodo (CERN European Organization for Nuclear Research)
VLSI and Analog Circuit Testing
preprint

Digit-Cycle Recurrence (DCR): Maximum Period, Ring-Theoretic Properties, and Deterministic Hardware Primitives

Seon-Woo Park
preprint en

Abstract

### SummaryThis paper presents a revised algebraic formalization of the Digit-Cycle Recurrence (DCR), a linear recurrence transformation defined over integer rings (Z/bZ)^n. We establish the exact Maximum Period Theorem for arbitrary composite bases b = ∏ p_i^(a_i) and digit length n ≥ 2, correcting previous estimations for prime power factors. Furthermore, we re-evaluate the hardware utility of DCR for lightweight Built-In Self-Test (BIST) pattern generation and deterministic sequence testing in integrated circuits.### Key Contributions* **Exact Order Theorem:** Proves the exact maximum period formula P_max(n, b) = b · ∏ p_i^⌊log_{p_i}(n-1)⌋ over general composite rings.* **Correction of Prior Discrepancies:** Resolves order calculation oversights for prime power components.* **Hardware Re-positioning:** Re-evaluates DCR from cryptographic PRNGs toward deterministic Memory BIST and logic test pattern generation.### Revision Note (v2)This updated version includes the finalized algebraic proofs, corrected matrix notation, and updated period validation tables.

Zenodo (CERN European Organization for Nuclear Research)
VLSI and Analog Circuit Testing
AI Navigator

Ask Laika to Summarize, Analyze, and Connect papers live on the map.

Summarize Papers & Methodologies

Extract key findings, datasets, and comparative methods across publications.

Benchmark Rankings & Visual Analytics

Rank top research institutions, authors, funders, topics, and journals by Field-Weighted Citation Impact (FWCI) and paper volume with instant charts.

Connect Distant Disciplines

Bridge topological clusters on the map to find hidden collaborative intersections.