Tolerance Inversion for Lens Support Loads Based on Feature-Enhanced Active-Learning Gaussian Process Regression

Support load fluctuations in lithographic objectives can induce additional surface figure errors in lenses. Conventional Monte Carlo-based tolerance analysis is computationally expensive in high-dimensional load spaces, and surrogate models based only on raw load inputs often fail to accurately capture local-extremum responses such as peak-to-valley (PV). To address the load tolerance inversion problem under prescribed PV and root mean square (RMS) constraints, a tolerance inversion framework integrating Regional Peak-to-Valley Fluctuation Features, Active-Learning Gaussian Process Regression, and dual-metric tolerance boundary search (RPVF-ALGPR) is proposed. The framework transforms the local fluctuation information in low-order Zernike-reconstructed wavefronts into regional peak-to-valley fluctuation features and combines them with the original support loads as inputs to the GPR surrogate models. It further combines posterior-uncertainty-driven active learning to construct surrogate models for both metrics, thereby enabling the inverse determination of the critical load fluctuation boundary. One set of training results from a biconvex lens case study shows that the proposed method effectively improves PV and RMS prediction accuracy and reduces the number of samples required to reach the prescribed accuracy threshold by 35.7% compared with random sampling. The results provide a reference for support-load tolerance allocation and optomechanical stability evaluation of high-precision lenses.

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Publication Details

Journal
Micromachines
Published
2026-08-14
DOI
https://doi.org/10.3390/mi17080960
Primary Topic
Adaptive optics and wavefront sensing
Type
article
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article

Tolerance Inversion for Lens Support Loads Based on Feature-Enhanced Active-Learning Gaussian Process Regression

H. Liu, Ji Zhou, Junbo Liu, Xia Kang et al.
Micromachines
Adaptive optics and wavefront sensing
article

Tolerance Inversion for Lens Support Loads Based on Feature-Enhanced Active-Learning Gaussian Process Regression

H. Liu, Ji Zhou, Junbo Liu, Xia Kang, Songmao Xian, ShiYu Li
article en

Abstract

Support load fluctuations in lithographic objectives can induce additional surface figure errors in lenses. Conventional Monte Carlo-based tolerance analysis is computationally expensive in high-dimensional load spaces, and surrogate models based only on raw load inputs often fail to accurately capture local-extremum responses such as peak-to-valley (PV). To address the load tolerance inversion problem under prescribed PV and root mean square (RMS) constraints, a tolerance inversion framework integrating Regional Peak-to-Valley Fluctuation Features, Active-Learning Gaussian Process Regression, and dual-metric tolerance boundary search (RPVF-ALGPR) is proposed. The framework transforms the local fluctuation information in low-order Zernike-reconstructed wavefronts into regional peak-to-valley fluctuation features and combines them with the original support loads as inputs to the GPR surrogate models. It further combines posterior-uncertainty-driven active learning to construct surrogate models for both metrics, thereby enabling the inverse determination of the critical load fluctuation boundary. One set of training results from a biconvex lens case study shows that the proposed method effectively improves PV and RMS prediction accuracy and reduces the number of samples required to reach the prescribed accuracy threshold by 35.7% compared with random sampling. The results provide a reference for support-load tolerance allocation and optomechanical stability evaluation of high-precision lenses.

MicromachinesVol. 17(8)
Institute of Optics and Electronics, Chinese Academy of Sciences (CN), University of Chinese Academy of Sciences (CN)
Sustainable cities and communities
Openalex Percentile: Top 11%
Adaptive optics and wavefront sensing
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Tolerance Inversion for Lens Support Loads Based on Feature-Enhanced Active-Learning Gaussian Process Regression — H. Liu, Ji Zhou, et al. · Micromachines (2026) | TGRS Research Map | TGRS