Direct RHEED VideoLearning and Prediction Using aHybrid Video Transformer–U-Net Framework for Molecular BeamEpitaxy
Abstract Reflection high-energy electron diffraction (RHEED) is a key in situ growth monitoring technique for molecular beam epitaxy (MBE). In conventional practice, only a limited portion of the information contained in RHEED patterns is analyzed during MBE growth due to the rich features in RHEED patterns. Machine-learning (ML)-assisted analysis has been employed to address this limitation, and more useful knowledge about thin-film growth has been extracted from RHEED patterns. Most existing approaches, however, rely on extracted RHEED features rather than directly learning from a spatiotemporal RHEED video. Here, we demonstrate the future-frame prediction of RHEED using a hybrid transformer framework that allows direct RHEED video learning and prediction. The predicted RHEED patterns match the ground-truth well. This study establishes a foundation for predictive MBE monitoring and advances ML-assisted RHEED-pattern analysis. The limitations of the framework are also discussed.
Authors
- Milad Fathabadi (ORCID: https://orcid.org/0009-0007-0084-9732)
- Shichen Li (ORCID: https://orcid.org/0000-0002-2993-2544)
- Mohammad Fazel Vafadar (ORCID: https://orcid.org/0000-0002-7214-1545)
- Songrui Zhao (ORCID: https://orcid.org/0000-0002-0277-040X)
Institutions
- McGill University (CA)
Publication Details
- Journal
- Crystal Growth & Design
- Published
- 2026-08-14
- DOI
- https://doi.org/10.1021/acs.cgd.6c00670
- Primary Topic
- Machine Learning in Materials Science
- Type
- article
- Field-Weighted Citation Impact
- 0.00