A Focusing Diffractive Optical Element for Flat-Top Beam Shaping Resilient to Etching Depth Errors

Diffractive optical elements (DOEs) have become core components for converting Gaussian beams into flat-top beams due to their advantages of flexible design, compact size, and precise control over light field distribution. However, during the fabrication of multi-step DOEs, some processes such as ion beam etching tend to produce etching depth errors, which cause deviations of the surface micro–nano phase structures from the designed values and thus severely degrade the beam shaping performance. This paper proposes a focusing DOE for flat-top beam shaping, which combines the focusing phase with the phase optimized by the weighted constraint iterative algorithm to establish a phase distribution resilient to etching depth errors. Thus, the proposed focusing DOE exhibits significantly improved robustness to etching depth errors and effectively reduces the structural complexity of laser optical systems. Our experimental results show that the designed DOE can stably convert the incident Gaussian beam into flat-top beams within the etching depth error range of ±30 nm, with both the flat-top beam uniformity and diffraction efficiency above 95%, and the maximum tolerable etching depth error reaches ±90 nm.

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Publication Details

Journal
Photonics
Published
2026-08-14
DOI
https://doi.org/10.3390/photonics13080765
Primary Topic
Advanced optical system design
Type
article
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article

A Focusing Diffractive Optical Element for Flat-Top Beam Shaping Resilient to Etching Depth Errors

Axiu Cao, Hui Pang, Cheng Xu, Qiling Deng et al.
Photonics
Advanced optical system design
article

A Focusing Diffractive Optical Element for Flat-Top Beam Shaping Resilient to Etching Depth Errors

Axiu Cao, Hui Pang, Cheng Xu, Qiling Deng, Yongqi Fu, Xiaohua Zeng
article en

Abstract

Diffractive optical elements (DOEs) have become core components for converting Gaussian beams into flat-top beams due to their advantages of flexible design, compact size, and precise control over light field distribution. However, during the fabrication of multi-step DOEs, some processes such as ion beam etching tend to produce etching depth errors, which cause deviations of the surface micro–nano phase structures from the designed values and thus severely degrade the beam shaping performance. This paper proposes a focusing DOE for flat-top beam shaping, which combines the focusing phase with the phase optimized by the weighted constraint iterative algorithm to establish a phase distribution resilient to etching depth errors. Thus, the proposed focusing DOE exhibits significantly improved robustness to etching depth errors and effectively reduces the structural complexity of laser optical systems. Our experimental results show that the designed DOE can stably convert the incident Gaussian beam into flat-top beams within the etching depth error range of ±30 nm, with both the flat-top beam uniformity and diffraction efficiency above 95%, and the maximum tolerable etching depth error reaches ±90 nm.

PhotonicsVol. 13(8)
University of Electronic Science and Technology of China (CN), Chinese Academy of Sciences (CN), Institute of Optics and Electronics, Chinese Academy of Sciences (CN)
Openalex Percentile: Top 18%
Advanced optical system design
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A Focusing Diffractive Optical Element for Flat-Top Beam Shaping Resilient to Etching Depth Errors — Axiu Cao, Hui Pang, et al. · Photonics (2026) | TGRS Research Map | TGRS