Drift Reduction in 2D PtSe ₂ Piezoresistive Pressure Sensors Through an On‐Chip Wheatstone Bridge

ABSTRACT Drift is a major cause of error affecting the accuracy and repeatability of sensors. For a sensor to be reliable, it must consistently output the same response to a constant physical quantity of interest under varying environmental conditions. A Wheatstone bridge (WSB) enables high sensitivity, accuracy, and common‐mode drift elimination, making it ideal for sensors with potentially high cross‐sensitivity. In this work, we apply this concept to highly sensitive piezoresistive pressure sensors made with two‐dimensional layered platinum diselenide (PtSe 2 ) transducers. By integrating the sensors into on‐chip WSBs, we minimize illumination‐induced drift, thereby enhancing overall sensor performance. The WSB‐integrated PtSe 2 pressure sensors were tested under ambient light and controlled illumination to quantify both the repeatability error and drift. The results demonstrate that the WSB effectively eliminates illumination‐induced drift relative to a reference sensor in a two‐probe configuration. This suggests that our WSB design is also more robust to other environmental factors, such as temperature and humidity.