Fail-Slow Hardware Failure Bug Analysis and Detection for Cloud Systems
Fail-slow hardwares are still running and functional, but in a degraded mode, thus slower than their expected performance. Bugs triggered by fail-slow hardwares cause severe cloud system failures. Existing testing tools fail to efficiently detect these bugs due to overlooking their characteristics. In order to address this problem, this paper provides a bug study that analyzes 48 real-world fail-slow hardware failures from typical cloud systems. We observe that (1) fail-slow hardwares make high-level software components vulnerable, including synchronized and timeout mechanisms; (2) the fine granularity of fail-slow hardwares is necessary to trigger these bugs. Based on these two observations, we propose Sieve, a fault injection testing framework for detecting fail-slow hardware failure bugs. Sieve statically analyzes target system codes to identify synchronized and timeout-protected I/O operations as candidate fault points and instruments hooks before candidate fault points to enable fail-slow hardware injection. To efficiently explore candidate fault points, Sieve adopts grouping and context-sensitive injection strategies. We have applied Sieve to three widely deployed cloud systems, i.e., ZooKeeper, Kafka, and HDFS. Sieve has detected six unknown bugs, two of which have been confirmed.
Authors
- Zhangyu Chen (ORCID: https://orcid.org/0000-0001-9020-3693)
- Menglei Chen (ORCID: https://orcid.org/0000-0001-5782-2361)
- Yu Hua (ORCID: https://orcid.org/0000-0001-7730-3796)
- Yongle Zhang (ORCID: https://orcid.org/0000-0001-5350-5182)
- Gen Dong (ORCID: https://orcid.org/0009-0000-0049-4862)
Institutions
- Purdue University West Lafayette (US)
- Huazhong University of Science and Technology (CN)
Publication Details
- Journal
- ACM Transactions on Computer Systems
- Published
- 2026-08-03
- DOI
- https://doi.org/10.1145/3838187
- Primary Topic
- Radiation Effects in Electronics
- Type
- article
- Field-Weighted Citation Impact
- 0.00