A Workflow for the Identification of Oligomeric Structures on Tilted Sample Planes in Cryo-SMLM

We introduce a workflow to identify oligomeric structures that are recorded with single-molecule localization microscopy (SMLM) under cryogenic conditions. Typically, these oligomers are assumed to consist of protomers arranged as equilateral two-dimensional polygons and every protomer is labeled with a dye molecule for visualization. Unlike previous work, we consider scenarios in which the sample plane has an unknown orientation relative to the focal plane. Our contribution is a high-precision plane-fitting algorithm to determine the sample plane, combined with geometrical transformations and two circle-fitting algorithms to identify the oligomeric structures. Our simulations on synthetic data demonstrate that the proposed workflow achieves high accuracy in estimating both the unknown tilted plane and the oligomer size.

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Publication Details

Journal
Optics
Published
2026-08-03
DOI
https://doi.org/10.3390/opt7040056
Primary Topic
Advanced Electron Microscopy Techniques and Applications
Type
article
Field-Weighted Citation Impact
0.00

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article

A Workflow for the Identification of Oligomeric Structures on Tilted Sample Planes in Cryo-SMLM

Magdalena C. Schneider, Otmar Scherzer, Gerhard J. Schuetz, Zheyi Yang et al.
Optics
Advanced Electron Microscopy Techniques and Applications
article

A Workflow for the Identification of Oligomeric Structures on Tilted Sample Planes in Cryo-SMLM

Magdalena C. Schneider, Otmar Scherzer, Gerhard J. Schuetz, Zheyi Yang, Yakun Dong
article en

Abstract

We introduce a workflow to identify oligomeric structures that are recorded with single-molecule localization microscopy (SMLM) under cryogenic conditions. Typically, these oligomers are assumed to consist of protomers arranged as equilateral two-dimensional polygons and every protomer is labeled with a dye molecule for visualization. Unlike previous work, we consider scenarios in which the sample plane has an unknown orientation relative to the focal plane. Our contribution is a high-precision plane-fitting algorithm to determine the sample plane, combined with geometrical transformations and two circle-fitting algorithms to identify the oligomeric structures. Our simulations on synthetic data demonstrate that the proposed workflow achieves high accuracy in estimating both the unknown tilted plane and the oligomer size.

OpticsVol. 7(4)
University of Vienna (AT), Howard Hughes Medical Institute (US), TU Wien (AT), Janelia Research Campus (US), Christian Doppler Laboratory for Thermoelectricity (AT), Johann Radon Institute for Computational and Applied Mathematics (AT)
Österreichische Nationalstiftung für Forschung, Technologie und Entwicklung, Austrian Science Fund, Christian Doppler Forschungsgesellschaft, Bundesministerium für Digitalisierung und Wirtschaftsstandort
Openalex Percentile: Top 11%
Advanced Electron Microscopy Techniques and Applications
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