Advanced Persistent Scatterer Interferometry products

Abstract. The Persistent Scatterer Interferometry technique has undergone strong development in the last decades. Despite this, there is still a need to improve its products. This paper describes a set of advanced Persistent Scatterer Interferometry products. The first product is the result of a joint processing of SAR data coming from multiple sensors. In this paper, we present a multi-sensor framework that integrates data coming from the C-band Sentinel-1 and X-band TerraSAR-X sensors. The second class of products are derived starting from the standard results of Persistent Scatterer Interferometry. Such products address specific application needs and that offer higher-level data with respect to the classical products. They include the so-called Active Deformation Area maps, the Classified Active Deformation maps, and the Building Differential Deformation maps that are focused on the spatial gradient of deformations. All these products are easy-to-handle, also for GIS non-experts. They can facilitate the interpretation and exploitation of the Persistent Scatterer Interferometry results for different types of applications.