Temperature-dependent reaction pathways of fluorination and nitridation in native Nb oxide under NF3/H-radical exposure

Native niobium forms Nb2O5 and NbOx upon air exposure, and these suboxide components are known to introduce two-level systems that limit the performance of superconducting quantum circuits. Reliable low-temperature modification of the native oxide is, therefore, of considerable interest. In this study, we systematically investigated the temperature-dependent reactions of native Nb oxides exposed to NF3 and H radicals from 25 to 250 °C. X-ray photoelectron spectroscopy revealed three distinct regimes: fluorination at 25 °C forming NbF5- and NH4F-like species; stabilization of NbO2F and fluorine-mediated nitridation at 100–150 °C; and a mechanistic transition at 200 °C, leading to the direct nitridation of Nb–O bonds and the formation of NbON. At 250 °C, deep nitridation penetrated into the underlying Nb metal, resulting in a thick NbON layer and a loss of selectivity. These results indicate that temperatures below 200 °C allow selective fluorination and nitridation of the native oxide while suppressing excessive modification of the underlying metallic Nb. The mechanistic insights obtained here provide a basis for understanding fluorination and nitridation reactions in Nb oxide under low-temperature radical-processing environments.

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Publication Details

Journal
Journal of Vacuum Science & Technology A Vacuum Surfaces and Films
Published
2026-07-30
DOI
https://doi.org/10.1116/6.0005517
Primary Topic
Semiconductor materials and devices
Type
article
Field-Weighted Citation Impact
0.00

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article

Temperature-dependent reaction pathways of fluorination and nitridation in native Nb oxide under NF3/H-radical exposure

Y. Fujita, Y. Urade, Go Fujii, Kazuhiko Endo et al.
Journal of Vacuum Science & Technology A Vacuum Surfaces and Films
Semiconductor materials and devices
article

Temperature-dependent reaction pathways of fluorination and nitridation in native Nb oxide under NF3/H-radical exposure

Y. Fujita, Y. Urade, Go Fujii, Kazuhiko Endo, Daisuke Ohori, K. Inomata, Yamato Aoyama
article en

Abstract

Native niobium forms Nb2O5 and NbOx upon air exposure, and these suboxide components are known to introduce two-level systems that limit the performance of superconducting quantum circuits. Reliable low-temperature modification of the native oxide is, therefore, of considerable interest. In this study, we systematically investigated the temperature-dependent reactions of native Nb oxides exposed to NF3 and H radicals from 25 to 250 °C. X-ray photoelectron spectroscopy revealed three distinct regimes: fluorination at 25 °C forming NbF5- and NH4F-like species; stabilization of NbO2F and fluorine-mediated nitridation at 100–150 °C; and a mechanistic transition at 200 °C, leading to the direct nitridation of Nb–O bonds and the formation of NbON. At 250 °C, deep nitridation penetrated into the underlying Nb metal, resulting in a thick NbON layer and a loss of selectivity. These results indicate that temperatures below 200 °C allow selective fluorination and nitridation of the native oxide while suppressing excessive modification of the underlying metallic Nb. The mechanistic insights obtained here provide a basis for understanding fluorination and nitridation reactions in Nb oxide under low-temperature radical-processing environments.

Journal of Vacuum Science & Technology A Vacuum Surfaces and FilmsVol. 44(5)
Tohoku University (JP), National Institute of Advanced Industrial Science and Technology (JP)
New Energy and Industrial Technology Development Organization
Openalex Percentile: Top 16%
Semiconductor materials and devices
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