Avalanche-gain-enabled voltage-programmable mid-infrared spectral sensing with a graded-bandgap HgCdTe photodiode
Miniaturized infrared spectrometers are vital for portable sensing, yet most single-detector computational schemes prioritize spectral encoding while overlooking weak-signal requirements in mid-infrared detection, where high absorption, low dark current, and internal gain are essential. Here, we propose and numerically validate a voltage-programmable spectral sensing concept based on a graded-bandgap HgCdTe avalanche photodiode. In this design, the composition gradient is repurposed as an active spectral-encoding coordinate. Through bias-dependent depletion, the device selectively accesses different absorption depths, while an N/P double-buffer architecture confines the high electric field within the wide-bandgap multiplication region, preserving avalanche gain while suppressing tunneling-related dark current in the absorber. Crucially, the multi-physics TCAD framework—incorporating wavelength-dependent absorption, carrier transport, tunneling, recombination, and impact ionization—is rigorously calibrated against experimental data from a baseline HgCdTe diode. These experimentally anchored simulations reveal distinct electrical fingerprints across 3–7 μm, driven by the coupled effects of absorption depth, photon flux, and wavelength-dependent avalanche path length. Compared to a conventional PIN structure, this architecture reduces dark-current density by one to two orders of magnitude at comparable gain. By processing these fingerprints with a noise-aware dual-branch neural network, discrete-band spectral reconstruction achieves a mean R2 of 0.9894 and a total-energy error of 3.21%. This work establishes a detector-physics-driven route toward filter-free, gain-assisted mid-infrared spectral sensing.
Authors
- Guanhai Li (ORCID: https://orcid.org/0000-0002-2745-055X)
- Huijun Guo (ORCID: https://orcid.org/0000-0002-6495-2954)
- Jia-Hao Chen (ORCID: https://orcid.org/0000-0001-9266-4178)
- Jin Chen (ORCID: https://orcid.org/0000-0003-0794-3995)
- Jiaji Yang (ORCID: https://orcid.org/0000-0002-4287-4924)
- Feilong Yu (ORCID: https://orcid.org/0000-0002-6993-6558)
- Xiaoshuang Chen (ORCID: https://orcid.org/0000-0003-0131-9454)
- Junzhe Gu
- Yuxing Song
- Wei Lu
- Sicheng Wang (ORCID: https://orcid.org/0009-0004-6758-2743)
- Xin Li (ORCID: https://orcid.org/0009-0005-7025-000X)
Institutions
- ShanghaiTech University (CN)
- Shanghai Institute of Technical Physics (CN)
- Institute for Advanced Study (DE)
- Shanghai Clinical Research Center (CN)
- University of Chinese Academy of Sciences (CN)
Publication Details
- Journal
- Journal of Applied Physics
- Published
- 2026-07-28
- DOI
- https://doi.org/10.1063/5.0343539
- Primary Topic
- Advanced Semiconductor Detectors and Materials
- Type
- article
- Field-Weighted Citation Impact
- 0.00