Recovering the electron mobility from conductivity measurements by stochastic projection methods

Abstract Stochastic projection methods are developed and applied in this study to recovering the electron mobility from conductivity measurements. The method can be interpreted as a conditional stochastic search for a solution of the first kind integral equation that minimizes the mean square residual under a set of conditions like boundedness, solution positivity, and smoothness properties. Synthetic data were used to analyze sensitivity of the calculated solutions. To validate the methods, simulations were performed to extract electron mobility from measured conductivity data for various semiconductor materials.