Deep quality prediction model for manufacturing process: Feature reconstruction and global information fusion solution
Accurate quality prediction in intelligent manufacturing is challenged by high-dimensional redundant data, insufficient spatiotemporal fusion, and poor model interpretability. While recent deep learning advances have improved prediction, they rarely address systematic feature reconstruction from redundant multi-parameter data or integrate spatial and temporal learning within a single framework. To address this problem, this paper proposes a deep learning framework that fills these gaps by integrating ReliefF-based feature reconstruction with a hybrid CNN–BiLSTM–attention architecture. ReliefF selects critical parameters and reduces redundancy; CNN–BiLSTM captures unified spatial–temporal dependencies; and attention weights influential features to enhance sensitivity and interpretability. Experiments on a real-world yarn manufacturing time-series dataset show that the proposed model outperforms state-of-the-art methods (including CNN, BiLSTM, CNN–BiLSTM, SVM, and PSO–DBN), achieving R 2 of 0.9536 and MAE of 0.1415. This work advances the knowledge of deep learning for manufacturing quality prediction by introducing a feature reconstruction-guided spatiotemporal attention framework, offering a more accurate and interpretable solution for complex multi-parameter processes.
Authors
- Qingan Qiu (ORCID: https://orcid.org/0000-0001-8741-0536)
- Sheng Hu (ORCID: https://orcid.org/0000-0001-8669-4469)
- Jiahui Tang (ORCID: https://orcid.org/0000-0002-4933-527X)
- Rongfa Wei
- Xinyu Zheng
Institutions
- Beijing Institute of Technology (CN)
- Xi'an Polytechnic University (CN)
- Hubei University of Technology (CN)
Publication Details
- Journal
- Proceedings of the Institution of Mechanical Engineers Part B Journal of Engineering Manufacture
- Published
- 2026-07-27
- DOI
- https://doi.org/10.1177/09544054261465103
- Primary Topic
- Digital Transformation in Industry
- Type
- article
- Field-Weighted Citation Impact
- 0.00