Where to Draw the Line Between Unit Tests and Integration Tests (archived 2026-09-01)

We organize the boundary between unit tests and integration tests along the axes of pure logic, formats, wiring, environment differences, and time dependence, and condense it into a decision table you can use without hesitation in practice. Archived version of https://comcomponent.com/en/blog/2026/03/25/004-unit-test-vs-integration-test-boundary-guide/, as published on 2026-09-01. The live article is maintained and may change after this date. First published 2026-03-25.

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Publication Details

Journal
Zenodo (CERN European Organization for Nuclear Research)
Published
2026-09-01
DOI
https://doi.org/10.5281/zenodo.21614586
Primary Topic
VLSI and Analog Circuit Testing
Type
article
Field-Weighted Citation Impact
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article

Where to Draw the Line Between Unit Tests and Integration Tests (archived 2026-09-01)

Go Komura
Zenodo (CERN European Organization for Nuclear Research)
VLSI and Analog Circuit Testing
article

Where to Draw the Line Between Unit Tests and Integration Tests (archived 2026-09-01)

Go Komura
article en

Abstract

We organize the boundary between unit tests and integration tests along the axes of pure logic, formats, wiring, environment differences, and time dependence, and condense it into a decision table you can use without hesitation in practice. Archived version of https://comcomponent.com/en/blog/2026/03/25/004-unit-test-vs-integration-test-boundary-guide/, as published on 2026-09-01. The live article is maintained and may change after this date. First published 2026-03-25.

Zenodo (CERN European Organization for Nuclear Research)
Fujikura (United States) (US)
Peace, Justice and strong institutions
Openalex Percentile: Top 21%
VLSI and Analog Circuit Testing
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