HAXPES and XPS reference spectra of bulk semimetallic HgTe with Al <i>Kα</i> and Cr <i>Kα</i> monochromatic sources
Monochromatic Al Kα (1486.6 eV) and monochromatic Cr Kα (5414.8 eV) radiation sources were used to acquire x-ray photoelectron spectroscopy (XPS) and hard x-ray photoelectron spectroscopy (HAXPES) data on bulk semimetallic HgTe. The reported spectra include survey scans, high-resolution core-level spectra of Hg and Te, and x-ray-excited Auger transitions. These data provide reference binding and kinetic energy values and are intended to support future XPS and HAXPES studies of HgTe and related materials.
Authors
- Nicolas Péré‐Laperne
- Emmanuel Lhuillier (ORCID: https://orcid.org/0000-0003-2582-1422)
- Debora Pierucci (ORCID: https://orcid.org/0000-0001-8751-1994)
- Dario Mastrippolito (ORCID: https://orcid.org/0000-0001-6360-7254)
- P. Fougères
- Charles Mansour (ORCID: https://orcid.org/0009-0008-2617-5470)
Institutions
- Centre National de la Recherche Scientifique (FR)
- Lyceum of the Philippines University (PH)
- Sorbonne Université (FR)
- Institut des NanoSciences de Paris (FR)
Publication Details
- Journal
- Surface Science Spectra
- Published
- 2026-07-23
- DOI
- https://doi.org/10.1116/6.0005588
- Primary Topic
- Advanced Semiconductor Detectors and Materials
- Type
- article
- Field-Weighted Citation Impact
- 0.00
Funders
- Agence Nationale de la Recherche
- Centre National de la Recherche Scientifique
- European Research Council