High‐Field Charge Transport Mechanisms in Crosslinked Polyethylene: The Role of Crosslinking‐Induced Structural Disorder

ABSTRACT Crosslinked polyethylene (XLPE) is the dominant insulation for high‐voltage direct current (HVDC) cables; however, its long‐term performance is influenced by charge transport and trapping behavior. In this work, the effect of crosslinking degree ( C GEL ) on the conduction mechanism and charge trapping characteristics of XLPE was systematically investigated by controlling the dicumyl peroxide (DCP) content from 1.4 to 2.0 phr. Gel content analysis confirmed that increasing DCP increased the C GEL from 72.4%~86.7%, while X‐ray diffraction revealed enhanced crystalline disorder and reduced crystallite size with increasing crosslinking. Current density measurements demonstrated space‐charge‐limited current (SCLC) behavior across all samples. Classical Poole‐Frenkel and Schottky analysis exhibited apparent linear relationships with electric field; however, the extracted dynamic relative permittivity ( ε r ) values were on the order of 10 6 ~10 7 , far exceeding the intrinsic dielectric constant of XLPE ( ε r = 2.3), indicating that neither mechanism adequately describes the conduction process. In contrast, the hopping conduction model provided excellent agreement with the experimental data over a wide temperature range (30°C~90°C) and electric field range (10~60 kV/mm), confirming hopping transport as the dominant high‐field conduction mechanism. Surface potential decay reveals a strong dependence of charge trapping behavior of C GEL . The optimally crosslinked sample (XLPE‐2) exhibited the lowest trap density ( N t = 4.48 × 10 20 eV −2 m −3 ), the shallowest trap energy level ( E t = 0.964 eV), and the fastest charge dissipation, whereas excessive crosslinking increased trap density and depth. These findings establish a relationship between crosslinking degree, structural disorder, charge trapping characteristics, and conduction behavior, providing important guidance for the optimization of XLPE insulation for HVDC cable applications.

Authors

Institutions

Publication Details

Journal
Polymer Engineering and Science
Published
2026-07-18
DOI
https://doi.org/10.1002/pen.70763
Primary Topic
High voltage insulation and dielectric phenomena
Type
article
Field-Weighted Citation Impact
0.00

Funders

Controls
|||
ALL TIME
JAN
FEB
MAR
APR
MAY
JUN
JUL
AUG
SEP
OCT
article

High‐Field Charge Transport Mechanisms in Crosslinked Polyethylene: The Role of Crosslinking‐Induced Structural Disorder

Gao Jz, Muneeb Ahmed, Hanbin Fu, Xinhao Gong et al.
Polymer Engineering and Science
High voltage insulation and dielectric phenomena
article

High‐Field Charge Transport Mechanisms in Crosslinked Polyethylene: The Role of Crosslinking‐Induced Structural Disorder

Gao Jz, Muneeb Ahmed, Hanbin Fu, Xinhao Gong, Gu Hongbo, Lisheng Zhong, Jing Lin
article en

Abstract

ABSTRACT Crosslinked polyethylene (XLPE) is the dominant insulation for high‐voltage direct current (HVDC) cables; however, its long‐term performance is influenced by charge transport and trapping behavior. In this work, the effect of crosslinking degree ( C GEL ) on the conduction mechanism and charge trapping characteristics of XLPE was systematically investigated by controlling the dicumyl peroxide (DCP) content from 1.4 to 2.0 phr. Gel content analysis confirmed that increasing DCP increased the C GEL from 72.4%~86.7%, while X‐ray diffraction revealed enhanced crystalline disorder and reduced crystallite size with increasing crosslinking. Current density measurements demonstrated space‐charge‐limited current (SCLC) behavior across all samples. Classical Poole‐Frenkel and Schottky analysis exhibited apparent linear relationships with electric field; however, the extracted dynamic relative permittivity ( ε r ) values were on the order of 10 6 ~10 7 , far exceeding the intrinsic dielectric constant of XLPE ( ε r = 2.3), indicating that neither mechanism adequately describes the conduction process. In contrast, the hopping conduction model provided excellent agreement with the experimental data over a wide temperature range (30°C~90°C) and electric field range (10~60 kV/mm), confirming hopping transport as the dominant high‐field conduction mechanism. Surface potential decay reveals a strong dependence of charge trapping behavior of C GEL . The optimally crosslinked sample (XLPE‐2) exhibited the lowest trap density ( N t = 4.48 × 10 20 eV −2 m −3 ), the shallowest trap energy level ( E t = 0.964 eV), and the fastest charge dissipation, whereas excessive crosslinking increased trap density and depth. These findings establish a relationship between crosslinking degree, structural disorder, charge trapping characteristics, and conduction behavior, providing important guidance for the optimization of XLPE insulation for HVDC cable applications.

Polymer Engineering and Science
Hengtong Optoelectronic (China) (CN), Fujian Electric Power Survey & Design Institute (CN), Xi'an Jiaotong University (CN)
National Key Research and Development Program of China
Affordable and clean energy
Openalex Percentile: Top 18%
High voltage insulation and dielectric phenomena
AI Navigator

Ask Laika to Summarize, Analyze, and Connect papers live on the map.

Summarize Papers & Methodologies

Extract key findings, datasets, and comparative methods across publications.

Benchmark Rankings & Visual Analytics

Rank top research institutions, authors, funders, topics, and journals by Field-Weighted Citation Impact (FWCI) and paper volume with instant charts.

Connect Distant Disciplines

Bridge topological clusters on the map to find hidden collaborative intersections.